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Electrostatic Force Microscopy (EFM)

Electrostatic Force Microscopy (EFM) uses a combination of TappingMode™, LiftMode™and a conductive afm tip to provide information pertaining to the electric field above a conductive sample. Each sample line is scanned using TappingMode to obtain topography data first. This topographic information is stored and retraced with a height offset in LiftMode, and the electrical data is then collected.
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