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Tip Radius (nm)
Nom: 35
Max: 50
Frequency (KHz)
Nom: 150
Min: 90
Max: 210
Length (µm)
Nom: 125
Min: 115
Max: 135
Spring Const (N/m)
Nom: 5
Min: 1.5
Max: 10
Width (µm)
Nom: 35
Min: 33
Max: 37
Order a free MESP-RC-V2 sample
Price: $753.50 (USD)
Sold in packs of 10
Questions? Free, Online Consulting

Built on the high-performance RTESP-150 AFM probe, the MESP-RC-V2's hard Cobalt-Chromium coating is tailored for high-sensitivity and magnetic contrast.  This cost-effective probe has a nominal tip radius of 35 nm for excellent lateral resolution for MFM, as well as other electrical and capacitance applications requiring a cantilever with conductive coating. 

The MESP-RC-V2 has a nominal coercivity of 400 Oe (medium), and a magnetic moment of 1e-13 EMU (medium). 

The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2.5 times that of an uncoated probe.

The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
Tip Specification
MESP-RC-V2 Tip Image
This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 17.5 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
MESP-RC-V2 Cantilever Image
The Cobalt-Chromium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1.75µm
Cantilever Thickness (RNG): 1.00 - 2.50µm
Back Side Coating: Reflective CoCr