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Tip Radius (nm)
Nom: 35
Max: 50
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 3.0
Min: 1.5
Max: 6.0
Width (µm)
Nom: 35
Min: 33
Max: 37
Order a free MESP-V2 sample
Price: $715.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting

Bruker's MESP-V2 magnetic probe is the industry standard for MFM imaging!


The hard Cobalt-Chrome coating on the tip is tailored for highly sensitive magnetic contrast and has a nominal coercivity of 400 Oe (medium) and a magnetic moment of 1e-13 EMU(medium). The 75khz cantilever frequency, 3N/m spring constant and ~35nm tip radius are optimal for use with dual pass, tapping based, MFM modes available as standard on most AFMs


Probe part numbers ending in -V2 provide:

Tighter dimensional specifications for improved probe to probe consistency

More precise alignment of the tip to the cantilever apex

Improved aesthetics

Tip Specification
MESP-V2 Tip Image
This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 17.5 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
MESP-V2 Cantilever Image
The Cobalt-Chromium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.80µm
Cantilever Thickness (RNG): 2.05 - 3.55µm
Back Side Coating: Reflective CoCr