DDESP-FM-V2

Geometry
RectangularTip Radius (nm)
Nom: 100
Max: 150
Frequency (KHz)
Nom: 105
Min: 80
Max: 130
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 6
Min: 3
Max: 12
Width (µm)
Nom: 35
Min: 33
Max: 37
Price: $1,300.00 (USD)
Sold in packs of 10
Order a free DDESP-FM-V2 sample
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Overview
Bruker DDESP-FM-V2 Electrical Probes
Providing consistent performance and high sensitivity.
Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.
The DDESP-FM-V2 probe provides:
Providing consistent performance and high sensitivity.
Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.
The DDESP-FM-V2 probe provides:
- • High electrical performance due to its consistent tip shape
• Sensitive nanoelectrical measurements with highly conductive coating
• High resolution electrical imaging with a sharp conductive tip - • High quality probe manufactured by Bruker AFM Probes
Other applications of the DDESP-FM-V2 probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications.
Tip Specification

Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 17.5 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification

Material: 0.010-0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.95µm
Cantilever Thickness (RNG): 2.20 - 3.70µm
Back Side Coating: Reflective Aluminum