Sample

Application

Mode

AFM

Resonant Frequency:

kHz

Spring Constant:

N/m

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FASTSCAN-D-SS

New super sharp probe for highest resolution imaging at high scan speeds.Optimized for PeakForce Tap

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DDESP-FM-V2

Product Description:

Bruker DDESP-FM-V2 Electrical Probes

Providing consistent performance and high sensitivity.

Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.

The DDESP-FM-V2 probe provides:

• High electrical performance due to its consistent tip shape
• Sensitive nanoelectrical measurements with highly conductive coating
• High resolution electrical imaging with a sharp conductive tip
• High quality probe manufactured by Bruker AFM Probes

Other applications of the DDESP-FM-V2 probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications.

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Model	Instrument	Mount	Pack Size	Price	Pack Quantity
DDESP-FM-V2	All	Unmounted	10	$1,300.00 (USD)

Quantity discounts available

Qty	Price/Pack
2-6	$1,105.00 (USD)
7-15	$975.00 (USD)
16-24	$845.00 (USD)
25-37	$715.00 (USD)
38+	$585.00 (USD)

Shape	Resonant Freq. kHz			Spring Const. N/m			Length µm			Width µm
Shape	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.
Rectangular	105	80	130	6	3	12	225	215	235	35	33	37

Tip Specification

The doped diamond coating is used to harden the tip in applications that require both increased wear resistance and a conductive tip. The tradeoff for the increased lifetime is that the coating also increases the diameter of the tip. If a conductive coating is not needed, the DLC coated probes (Model# TESPD) provide a cost effective alternative.

Tip Schematic

Geometry:	Standard (Steep)
Tip Height (h):	10 - 15µm
Front Angle (FA):	25 ± 2.5º
Back Angle (BA):	17.5 ± 2.5 º
Side Angle (SA):	20 ± 2.5 º
Tip Radius (Nom):	100 nm
Tip Radius (Max):	150 nm
Tip SetBack (TSB)(Nom):	14 µm
Tip Set Back (TSB)(RNG):	11 - 16 µm
Tip Coating:	Conductive Diamond

Cantilever Specification

The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.

Cantilever schematic

Material:	0.010-0.025 Ωcm Antimony (n) doped Si
Geometry:	Rectangular
Cantilevers Number:	1
Cantilever Thickness (Nom):	2.95 µm
Cantilever Thickness (RNG):	2.20 - 3.70 µm
Front Side Coating:	Conductive Diamond
Back Side Coating:	Reflective Aluminum