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Probes → SCM-PIC-V2

SCM-PIC-V2

SCM-PIC-V2
Geometry
Rectangular
Tip Radius (nm)
Nom: 25
Frequency (KHz)
Nom: 10
Min: 4
Max: 16
Length (µm)
Nom: 450
Min: 440
Max: 460
Spring Const (N/m)
Nom: 0.10
Min: 0.03
Max: 0.20
Width (µm)
Nom: 35
Min: 33
Max: 37
3 Total Related Products
CONTV-PT
A pack of Conductive Silicon Probes. 

Bruker's Value Line Probe for Electrical Characterization using Contact Mode in air.

Specifications:
- Tip radius of 25 nm nominal.
- Platinum-Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications.
-The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip.
- The coating on the back side of the cantilever enhances laser reflectivity.
- Unmounted for all AFMs.View...
SCM-PTSI
Bruker SCM-PtSi Probes

For the highest resolution nanoelectrical measurements with outstanding wear resistance.

Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its outstanding wear resistant properties. 

  • The Bruker SCM-PtSi probe provides:
  • • High resolution electrical imaging with an ultra-sharp conductive tip
    • Consistent performance with high measurement lifetime
    • Highly sensitive nanoelectrical measurements
  • • High quality probe manufactured at Bruker AFM Probes

    • Other applications of the SCM-PtSi probe include: conductivity measurements (Conductive AFM (C-AFM) and PeakForce TUNA), Electrical Force Microscopy (EFM), and other characterization applications.

Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM & PeakForce TUNA modes.


View...
SCM-PIT-V2
Built on the high-performance RFESP-75 AFM probe, Bruker's SCM-PIT-V2 probe has a Platinum-Iridium coated,electrically conductive tip that is ideal for Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and other electrical characterization applications.  The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apexof the tip.  The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2.5 times. 

AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.

Bruker's SCM-PIT-V2 probe replaces the legacy SCM-PIT probe.  
The SCM-PIT-V2 design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics

View...
Order a free SCM-PIC-V2 sample
Price: $495.00 (USD)
Sold in packs of 10
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Shipping Info
Probe Selection Guide
Email Us
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
Built on the high-performance RESP-10 AFM probe, Bruker's SCM-PIC-V2 probe has a Platinum-Iridiumcoated,electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM), Kelvin Probe Force Microscopy (KPFM), ScanningCapacitance Microscopy (SCM), and other electrical characterizationapplications.  The Pt-Ir coating on the front side of the cantileverprovides a metallic electrical path from the cantilever die to the apexof the tip.  The coating on the back side of the cantilever compensatesfor the stress created by the front side coating and also enhances laserreflectivity by a factor of up to 2.5 times.

AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.

Bruker's SCM-PIC-V2 probe replaces the legacy SCM-PIC probe. Bruker recommends transitioning to this probe. 
The SCM-PIC-V2 design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
Tip Specification
SCM-PIC-V2 Tip Image
This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 17.5 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
SCM-PIC-V2 Cantilever Image
The Platinum-Iridium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1.8µm
Cantilever Thickness (RNG): 1.05 - 2.55µm
Back Side Coating: Reflective PtIr
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