Skip to Main Content

SCM-PIC-V2

SCM-PIC-V2
Geometry
Rectangular
Tip Radius (nm)
Nom: 25
Frequency (KHz)
Nom: 10
Min: 4
Max: 16
Length (µm)
Nom: 450
Min: 440
Max: 460
Spring Const (N/m)
Nom: 0.10
Min: 0.03
Max: 0.20
Width (µm)
Nom: 35
Min: 33
Max: 37
Price: $450.00 (USD)
Sold in packs of 10
+
-
Order a free SCM-PIC-V2 sample
Questions? Free, Online Consulting
Overview
Built on the high-performance RESP-10 AFM probe, Bruker's SCM-PIC-V2 probe has a Platinum-Iridiumcoated,electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM), Kelvin Probe Force Microscopy (KPFM), ScanningCapacitance Microscopy (SCM), and other electrical characterizationapplications.  The Pt-Ir coating on the front side of the cantileverprovides a metallic electrical path from the cantilever die to the apexof the tip.  The coating on the back side of the cantilever compensatesfor the stress created by the front side coating and also enhances laserreflectivity by a factor of up to 2.5 times.

AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.

Bruker's SCM-PIC-V2 probe replaces the legacy SCM-PIC probe. Bruker recommends transitioning to this probe. 
The SCM-PIC-V2 design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
Tip Specification
SCM-PIC-V2 Tip Image
This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 17.5 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
SCM-PIC-V2 Cantilever Image
The Platinum-Iridium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1.8µm
Cantilever Thickness (RNG): 1.05 - 2.55µm
Back Side Coating: Reflective PtIr
Loading...