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Tip Radius (nm)
Nom: 25
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 230
Min: 225
Max: 235
Spring Const (N/m)
Nom: 2.8
Min: 1
Max: 5
Width (µm)
Nom: 33
Min: 28
Max: 38
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Price: $246.75 (USD)
Sold in packs of 10
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A pack of Conductive Silicon Probes. 

Bruker's Value Line Probe for Electrical Characterization with soft TappingMode or other "AC/non-contact modes."

- Tip radius of 25 nm nominal.
- Platinum-Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications.
-The Pt-Ir coating on the front side of the cantilever provides ametallic electrical path from the cantilever die to the apex of the tip.
- The coating on the back side of the cantilever enhances laser reflectivity.
- Unmounted for all AFMs.
Tip Specification
FMV-PT Tip Image
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 15 ± 2.5ºº
Side Angle (SA): 22.5 ± 2.5ºº
Cantilever Specification
FMV-PT Cantilever Image
Material: 0.01 - 0.025 Ocm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75µm
Cantilever Thickness (RNG): 2.0 - 3.5µm
Back Side Coating: Reflective PtIr