Bruker Introduces AFM-Based nano-DMA Solution
Providing First and Only AFM Viscoelastic Measurements that Match Bulk DMA
BOSTON, Massachusetts – November 27, 2018 – At the 2018 MRS Fall Meeting & Exhibit, Bruker today announced the relea...
See all articlesPeakForce Tapping & QNM
PeakForce Tapping™ is an AC imaging technique, i.e., the cantilever is oscillated but well below resonance. This results in a continuous series of force-distance curves. In addition to dire...
See all articlesLiftMode
LiftMode™is not an imaging mode, as it by itself does not measure a new quantity to reveal new information, but rather a technique that enables other modes such as MFM, EFM, and SCM. In LiftMode...
See all articlesMagnetic Force Microscopy – MFM
Magnetic Force Microscopy (MFM) uses a combination of TappingMode™, LiftMode™ and a properly prepared tip to gather information about the magnetic field above a sample. Each line of the sampl...
See all articlesSurface Potential Microscopy – SPoM
Surface Potential Microscopy (SPoM) is based on the macroscopic Kelvin method. SPoM is able to measure surface topography and surface potential (VDC) information simultaneously. Topography is acqu...
See all articlesScanning Tunneling Microscopy – STM
STM is a primary AFM mode. The probe is a metal needle. Detector signal is the tunneling current between the tip and sample when an electrical bias, V, is applied. In feedback mode, output signal ...
See all articlesTorsional Resonance
During Torsional Resonance (TR) Mode, the tip is actuated parallel rather then vertical with respect to the surface. Forces between tip and sample cause a change in resonance behavior that can be ...
See all articlesTUNA & Conductive AFM
TUNA and Conductive AFM use contact mode AFM and a conductive probe. Sensor signal is the electric current between tip and sample for an applied DC bias. In feedback mode, the output signal is the...
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