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Tip Radius (nm)
Nom: 25
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 3.0
Min: 1.5
Max: 6.0
Width (µm)
Nom: 35
Min: 33
Max: 37
Order a free SCM-PIT-V2 sample
Price: $520.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting

Bruker's SCM-PIT-V2 probe is the go-to electrical probe! Based on a 75khz, 3N/m, 225um long cantilever, this probe has a Platinum-Iridium coated tip side and reflex coating. Perfect for tapping based electrical modes such as EFM and KPFM. Also can be used for contact based and datacube based modes such as SCM and PFM. Simply the best multifunctional electrical AFM probe to have in your quiver!


Probe part numbers ending in -V2 provide:

Tighter dimensional specifications for improved probe to probe consistency

More precise alignment of the tip to the cantilever apex

Improved aesthetics

Tip Specification
SCM-PIT-V2 Tip Image
This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 17.5 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
SCM-PIT-V2 Cantilever Image
The Platinum-Iridium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.80µm
Cantilever Thickness (RNG): 2.05 - 3.55µm
Back Side Coating: Reflective PtIr