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SCM-PIT-V2

SCM-PIT-V2
Geometry
Rectangular
Tip Radius (nm)
Nom: 25
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 3.0
Min: 1.5
Max: 6.0
Width (µm)
Nom: 35
Min: 33
Max: 37
Price: $450.00 (USD)
Sold in packs of 10
Order a free SCM-PIT-V2 sample
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
Built on the high-performance RFESP-75 AFM probe, Bruker's SCM-PIT-V2 probe has a Platinum-Iridium coated,electrically conductive tip that is ideal for Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and other electrical characterization applications.  The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apexof the tip.  The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2.5 times. 

AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.

Bruker's SCM-PIT-V2 probe replaces the legacy SCM-PIT probe.  
The SCM-PIT-V2 design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics

Tip Specification
SCM-PIT-V2 Tip Image
This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 17.5 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
SCM-PIT-V2 Cantilever Image
The Platinum-Iridium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.80µm
Cantilever Thickness (RNG): 2.05 - 3.55µm
Back Side Coating: Reflective PtIr
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