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SCM-PIT-V2

Geometry
RectangularTip Radius (nm)
Nom: 25
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 3.0
Min: 1.5
Max: 6.0
Width (µm)
Nom: 35
Min: 33
Max: 37
Order a free SCM-PIT-V2 sample
Price: $495.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
Built on the high-performance RFESP-75 AFM probe, Bruker's SCM-PIT-V2 probe has a Platinum-Iridium coated,electrically conductive tip that is ideal for Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and other electrical characterization applications. The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apexof the tip. The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2.5 times.
AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.
Bruker's SCM-PIT-V2 probe replaces the legacy SCM-PIT probe.
The SCM-PIT-V2 design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.
Bruker's SCM-PIT-V2 probe replaces the legacy SCM-PIT probe.
The SCM-PIT-V2 design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.80µm
Cantilever Thickness (RNG): 2.05 - 3.55µm
Back Side Coating: Reflective PtIr