SCM-PIT-V2

Bruker's new PeakForce KPFM probes, 10-pack.  300 kHz, 1.5 N/m.

A 10-pack of sharp nitride lever probes ideally suited for Peak Force Quantitative Nano-Electric measurements.  These probes are tailored for specific high resolution electrical measurements by matching the softness of a nitride cantilever with the sharpness of an uncoated silicon probe.

In July 2015 Bruker implemented a new process to achieve higher quality and consistency in this probe's physical appearance and dimensions.  Our goal is to provide improved user results in consistency of rendered resolution and less variation to instrument settings.  We would like to hear your feedback on how these improvements have affected your results.  Please contact us and let us know!
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Bruker SCM-PtSi Probes

For the highest resolution nanoelectrical measurements with outstanding wear resistance.

Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its outstanding wear resistant properties. 

• The Bruker SCM-PtSi probe provides:
• • High resolution electrical imaging with an ultra-sharp conductive tip
  • Consistent performance with high measurement lifetime
  • Highly sensitive nanoelectrical measurements
• • High quality probe manufactured at Bruker AFM Probes

Other applications of the SCM-PtSi probe include: conductivity measurements (Conductive AFM (C-AFM) and PeakForce TUNA), Electrical Force Microscopy (EFM), and other characterization applications.

Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM & PeakForce TUNA modes.

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Built on the high-performance RESP-10 AFM probe, Bruker's SCM-PIC-V2 probe has a Platinum-Iridiumcoated,electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM), Kelvin Probe Force Microscopy (KPFM), ScanningCapacitance Microscopy (SCM), and other electrical characterizationapplications.  The Pt-Ir coating on the front side of the cantileverprovides a metallic electrical path from the cantilever die to the apexof the tip.  The coating on the back side of the cantilever compensatesfor the stress created by the front side coating and also enhances laserreflectivity by a factor of up to 2.5 times.

AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.

Bruker's SCM-PIC-V2 probe replaces the legacy SCM-PIC probe. Bruker recommends transitioning to this probe. 
The SCM-PIC-V2 design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
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