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Magnetic Force Microscopy (MFM)

Magnetic Force Microscopy (MFM) uses a combination of TappingMode™, LiftMode™ and a magnetized tip to gather information about the magnetic field above a sample. Each sample line is scanned using TappingMode to obtain topography data first. This topographic information is stored and retraced with a height offset in LiftMode, and the magnetic data is then collected.