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Magnetic Force Microscopy (MFM)
Magnetic Force Microscopy (MFM) uses a combination of TappingMode™, LiftMode™ and a magnetized tip to gather information about the magnetic field above a sample. Each sample line is scanned using TappingMode to obtain topography data first. This topographic information is stored and retraced with a height offset in LiftMode, and the magnetic data is then collected.
Frequency
Nom: 75KHz
Spring Const.
Nom: 3.0N/m
Geometry
Rectangular
Tip Radius
25nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
MagneticF: Magnetic CoCr
B: Reflective CoCr
Frequency
Nom: 150KHz
Spring Const.
Nom: 5N/m
Geometry
Rectangular
Tip Radius
35nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
F: Magnetic CoCr
B: Reflective CoCr
Frequency
Nom: 75KHz
Spring Const.
Nom: 3.0N/m
Geometry
Rectangular
Tip Radius
80nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
MagneticF: Magnetic CoCr
B: Reflective CoCr
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Geometry
Rectangular
Tip Radius
25-80nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
MagneticF: Magnetic
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Tip Radius
40nmMaterial
Side-coating of 35 nm NiCo and a backside reflex coating of AlCoating
B: Al
CALL TO ORDER
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Tip Radius
40nmMaterial
Side-coating of 20 nm NiCo and a backside reflex coating of AlCoating
B: Al
CALL TO ORDER
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Tip Radius
40nmMaterial
Side-coating of 10 nm NiCo and a backside reflex coating of AlCoating
B: Al
CALL TO ORDER
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Tip Radius
40nmMaterial
Side coating of 35 nm Ni and an Al backside reflex coating.Coating
B: Al
CALL TO ORDER
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Tip Radius
40nmMaterial
Side-coating of 20 nm NiCo and a backside reflex coating of AlCoating
B: Al
CALL TO ORDER