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RMN-25PT300B
Geometry
RectangularFrequency (KHz)
Nom: 20
Min: 14
Max: 26
Length (µm)
Nom: 300
Min: 350
Max: 250
Spring Const (N/m)
Nom: 18
Min: 10.8
Max: 25.2
Width (µm)
Nom: 100
Min: 90
Max: 110
Order a free RMN-25PT300B sample
Price: $900.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
Solid Metal Probe, 18 N/m, 20 kHz
RockyMountain Nanotechnology (RMN) probes are uniquely constructed from pureplatinum and placed on a standard AFM probe sized ceramic substrate.Solid metal probes offer excellent conductivity and suffer no thin-filmadhesion problems that occur with metal-coated silicon probes. Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods. These probesare ideal for C-AFM, SCM, and KPFM/EFM applications. They are availablein a range of spring constants. Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm.
RockyMountain Nanotechnology (RMN) probes are uniquely constructed from pureplatinum and placed on a standard AFM probe sized ceramic substrate.Solid metal probes offer excellent conductivity and suffer no thin-filmadhesion problems that occur with metal-coated silicon probes. Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods. These probesare ideal for C-AFM, SCM, and KPFM/EFM applications. They are availablein a range of spring constants. Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm.
Tip Specification
Tip Height (h): ~100 µm
Cantilever Specification
Material: Solid Platinum
Geometry: Rectangular
Cantilevers Number: 1