Current In-Plane Tunneling (CIPT)

Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers. For more information on the CIPT method and associated instruments visit our product pages: CIPT Method | Bruker