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SCM-PTSI

SCM-PTSI
Geometry
Rectangular
Tip Radius (nm)
Nom: 15
Max: 20
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 200
Max: 250
Spring Const (N/m)
Nom: 2.8
Min: 1
Max: 5
Width (µm)
Nom: 28
Min: 23
Max: 33
Price: $1,680.00 (USD)
Sold in packs of 10
Order a free SCM-PTSI sample
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
Bruker SCM-PtSi Probes

For the highest resolution nanoelectrical measurements with outstanding wear resistance.

Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its outstanding wear resistant properties. 

  • The Bruker SCM-PtSi probe provides:
  • • High resolution electrical imaging with an ultra-sharp conductive tip
    • Consistent performance with high measurement lifetime
    • Highly sensitive nanoelectrical measurements
  • • High quality probe manufactured at Bruker AFM Probes

  • Other applications of the SCM-PtSi probe include: conductivity measurements (Conductive AFM (C-AFM) and PeakForce TUNA), Electrical Force Microscopy (EFM), and other characterization applications.

Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM & PeakForce TUNA modes.


Tip Specification
SCM-PTSI Tip Image
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 17.5 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
SCM-PTSI Cantilever Image
Material: 0.01 - 0.025 Ocm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75µm
Cantilever Thickness (RNG): 2.0 - 3.5µm
Back Side Coating: Reflective Al
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