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<div>When two materials are brought very close together, various interactions are present at the atomic level. These interactions are the basis for scanning probe microscopy. An AFM probe is particularly sensitive to such interactions and is designed to sense them. Specifically, when an AFM probe is brought very close to a sample surface, the interaction can be correlated to the distance between the probe and sample. Since the magnitude of this interaction varies as a function of the probe-sample distance, the AFM can map a sample’s surface topography by scanning the probe in a precise, controlled manner over the sample surface. </div><div><br /></div><div><br /></div><div><br /></div><div>The quality of data obtained with an AFM is strongly dependent on the type and quality of the probe in use. Traditional triangular silicon nitride cantilever probes are robust and relatively inexpensive. Etched silicon cantilevers with integrated tips have a higher aspect ratio and smaller end radius than silicon nitride. The choice of probe depends on multiple variables, such as application and imaging environment. For example, the smaller end radius of etched silicon tips creates greater pressure between the tip and sample. Consequently, these probes are not recommended for soft samples.</div>
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CDF100
Flared Re-Entrant Tips for 3-D Imaging 100 nm W, 300 nm L, 5-Pack
CDNISP-HS
Hand-crafted natural diamond Nanoindenting tip.  - Mounted for the BioScope Catalyst. - High spr...
CDR130C
Round Re-Entrant Tips for 3-D imaging Max Width = 140 nm Max Overhang = 25 nm Max Effective Leng...
CDT850
Triangular Re-Entrant Tips for 3-D imaging Max Width = 850 nm Max Overhang = 250 nm Max Effectiv...
CLFC-NOBO
A pack of Calibration Probes A variety pack of tipless calibration levers with three different spr...
CLFC-NOCAL
A pack of tipless cantilevers, each with a different spring constant.  - "A" Cantilever: 10.4 N/m...
CLFC-NOMB
A pack of Calibration ProbesA variety pack of tipless calibration levers with three different sprin...
CLST-PTBO
A pack of STM ProbesPrecision-cut Platinum/Iridium wire for Scanning Tunneling Microscopy.  Unmount...
CONTV
A pack of Silicon Probes.Quantity=10Bruker's Value Line of Contact Mode in air ONLY probes.  This p...
CONTV-A
A pack of Silicon Probes.Quantity=10Bruker's Value Line of Contact Mode in air ONLY probes, with re...
CONTV-AW
A pack of Silicon Probes.Quantity=WaferBruker's Value Line of Contact Mode in air ONLY probes, with...
CONTV-PT
A pack of Conductive Silicon Probes.  Bruker's Value Line Probe for Electrical Characterization usi...
DCS-40
High Density Carbon Spike, 40 nm diameter, 400 nm length, 2-Pack.
DDESP-10
***Note: Bruker has launched an improved DDESP-V2 probe and recommends customers transition to this...
DDESP-FM-10
***Note: Bruker has launched an improved DDESP-FM-V2 probe and recommends customers transition to t...
DDESP-FM-V2
Bruker DDESP-FM-V2 Electrical ProbesProviding consistent performance and high sensitivity.Bruker's ...
DDESP-V2
Bruker DDESP-V2 Electrical Probes ***Note: Bruker's new DDESP-V2 probe replaces the legacy DDESP...
DNISP
Hand-crafted natural diamond Nanoindenting tip.  - Unmounted for all AFMs. - Quantity=1 - Speci...
DNISP-HS
Hand-crafted natural diamond Nanoindenting tip.  - Unmounted for all AFMs. - High spring constan...
DNISP-MM
Hand-crafted natural diamond Nanoindenting tip.  - Mounted for the MultiMode AFM. - Quantity=1 ...
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