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Mode → Lateral Force Microscopy (LFM)

Lateral Force Microscopy (LFM)

Lateral Force Microscopy (LFM) measures frictional forces on a sample surface by measuring the “twist” of the AFM cantilever. Data from this mode helps identify areas on a sample where there are relative friction differences.
Value Line
CONTV-A
CONTV-A
Frequency
Nom: 13KHz
Spring Const.
Nom: 0.2N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Details
CONTV
CONTV
Frequency
Nom: 13KHz
Spring Const.
Nom: 0.2N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Details
ESPA-V2
ESPA-V2
Frequency
Nom: 13KHz
Spring Const.
Nom: 0.2N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Learn More
+
-
ESP-V2
ESP-V2
Frequency
Nom: 13KHz
Spring Const.
Nom: 0.2N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Learn More
+
-
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