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Force Spectroscopy
Force spectroscopy is the direct measurement of tip-sample interaction of forces as a function of the gap between the tip and sample. If there is force acting on the AFM probe, the cantilever will deflect, and this deflection is proportional to the force acting on the cantilever.
Frequency
Nom: 70KHz
Spring Const.
Nom: 0.4N/m
Geometry
Triangular
Tip Radius
2nmMaterial
Silicon NitrideCoating
B: Reflective Aluminum
Frequency
Nom: 150KHz
Spring Const.
Nom: 0.7N/m
Geometry
Triangular
Tip Radius
2nmMaterial
Silicon NitrideCoating
B: Reflective Gold
Frequency
Nom: 150KHz
Spring Const.
Nom: 0.7N/m
Geometry
Triangular
Tip Radius
20nmMaterial
Silicon NitrideCoating
B: Reflective Gold
Frequency
Nom: 293KHz
Spring Const.
Nom: 10.4N/m
Geometry
A Rectangular Material
1 Ωcm Silicon
Frequency
Nom: 293KHz
Spring Const.
Nom: 10.4N/m
Geometry
A Rectangular Material
1 Ωcm Silicon