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Tip Radius (nm)
Nom: 100
Max: 150
Frequency (KHz)
Nom: 450
Min: 300
Max: 600
Length (µm)
Nom: 125
Min: 115
Max: 135
Spring Const (N/m)
Nom: 80
Min: 30
Max: 180
Width (µm)
Nom: 40
Min: 38
Max: 42
Order a free DDESP-V2 sample
Price: $1,400.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Bruker DDESP-V2 Electrical Probes

Providing consistent performance and high sensitivity.

Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices,  Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.

The DDESP-V2 probe provides:
  • • High electrical performance due to its consistent tip shape
    • Sensitive nanoelectrical measurements with highly conductive coating
    • High resolution electrical imaging with a sharp conductive tip
  • • High quality probe manufactured by Bruker AFM Probes

Other applications of the DDESP-V2 probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications.

For the highest resolution SSRM measurements, Bruker also offers solid diamond probes with pyramidal tips; please see model SSRM-DIA.

For non-electrical applications where wear resistance is required, the diamond-like carbon (DLC) coated probes, Model TESPD provide a cost effective alternative.

Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM & PeakForce TUNA modes.

Tip Specification
DDESP-V2 Tip Image
The doped diamond coating is used to harden the tip in applications that require both increased wear resistance and a conductive tip. The tradeoff for the increased lifetime is that the coating also increases the diameter of the tip. If a conductive coating is not needed, the DLC coated probes (Model# TESPD) provide a cost effective alternative.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 17.5 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
DDESP-V2 Cantilever Image
The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.010-0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.6µm
Cantilever Thickness (RNG): 2.85 - 4.35µm
Back Side Coating: Reflective Aluminum