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Dimension
Bruker’s large-sample Dimension AFMs deliver point defect resolution with open stage flexibility. Featuring high-resolution AFM performance normally associated with the best small-sample systems, these high-speed AFMs have been designed from top to bottom to deliver the lowest drift and noise. Researchers are now able to achieve high-resolution artifact-free images in minutes instead of hours. Utilizing exclusive PeakForce Tapping, Bruker’s Dimension AFMs go beyond topography to provide quantitative nanomechanical and nanoelectrical data of real-time changes.
Highly-ordered pyrolytic graphite, Grade ZYB
Contact AFM & TappingMode (air) cantilever holder
SPM sample mounting disks, steel, 15mm diameter
Sample to demonstrate imaging work function differences for KPFM.
SPM sample mounting disks, steel, 12mm diameter
Sample adhesive pads, full package
Sapphire Sample, 12mm Mounted
AFM sample Mica disks, 12mm
HarmoniX Training Sample for MultiMode and Dimenstion SPMs, 12mm
Polystyrene Film Sample, 2.7GPa, 12mm, Mounted
Non-Magnetic Contact AFM & TappingMode (Air) Cantilever Holder
Magnetic Field Microscopy Sample, on 15mm Puck
Scanning Capacitance Sample, on 15mm Puck
Periodically poled lithium niobate (PPLN), mounted onto 15mm steel puck
PDMS Gel Sample, Tack 0, 12mm Mounted