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Tunneling AFM (TUNA)
TUNA and Conductive AFM use a conductive afm probe in contact mode. The sensor signal is the electric current between the afm tip and the conductive sample for an applied DC bias. In feedback mode, the output signal is the DC bias, adjusted to maintain the electric current setpoint. Currents range from µA for CAFM to fA for TUNA. Applications include experimentation in thin film dielectrics for both strength and thickness uniformity in thin films of semiconductor and data storage devices as well as conductive polymers.
Frequency
Nom: 75KHz
Spring Const.
Nom: 3.0N/m
Geometry
Rectangular
Tip Radius
25nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
PtIrF: Conductive PtIr
B: Reflective PtIr
Frequency
Nom: 10KHz
Spring Const.
Nom: 0.10N/m
Geometry
Rectangular
Tip Radius
25nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
PtIrF: Conductive PtIr
B: Reflective PtIr
Frequency
Nom: 20KHz
Spring Const.
Nom: 18N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum
Frequency
Nom: 9KHz
Spring Const.
Nom: 0.8N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum
Frequency
Nom: 5KHz
Spring Const.
Nom: 0.3N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum
Frequency
Nom: 8KHz
Spring Const.
Nom: 10N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum
Frequency
Nom: 180KHz
Spring Const.
Nom: 40N/m
Geometry
Rectangular
Tip Radius
10 ± 5nmMaterial
Single Crystal DiamondCoating
Highly conductive single crystal diamondB: Reflective Au
Frequency
Nom: 65KHz
Spring Const.
Nom: 2.8N/m
Geometry
Rectangular
Tip Radius
<5nm
Frequency
Nom: 65KHz
Spring Const.
Nom: 2.8N/m
Geometry
Rectangular
Tip Radius
10 ± 5nm
Frequency
Nom: 180KHz
Spring Const.
Nom: 40N/m
Geometry
Rectangular
Tip Radius
<5nmMaterial
Single Crystal DiamondCoating
Highly conductive single crystal diamondB: Reflective Au