Skip to Main Content

Close

Account

Your Account
Login
Orders

0

Products
- Probes
  
  View All Probes
  
  AFM-IR
  
  Conductive AFM (CAFM)
  
  Contact Mode
  
  Contact Resonance
  
  Critical Dimension (CD) AFM
  
  Current In-Plane Tunneling (CIPT)
  
  Deep Trench (DT)
  
  Electrical Spectroscopy
  
  Electrostatic Force Microscopy (EFM)
  
  Fast Scan
  
  FASTForce Volume
  
  Force Modulation
  
  Force Spectroscopy
  
  HarmoniX
  
  Lateral Force Microscopy (LFM)
  
  Magnetic Force Microscopy (MFM)
  
  NanoIndentation
  
  Nanoscale Thermal Analysis
  
  PeakForce Deep Trench
  
  PeakForce QNM
  
  PeakForce QNM High-Accuracy
  
  PeakForce Tapping
  
  PeakForce TUNA
  
  Piezoresponse/ Piezoforce Microscopy (PFM)
  
  ScanAsyst
  
  Scanning Capacitance Mode (SCM)
  
  Scanning Electrochemical Potential Microscopy (SECPM)
  
  Scanning Microwave Impedance Microscopy (sMIM)
  
  Scanning Spreading Resistance Mode (SSRM)
  
  Scanning Tunneling Microscopy (STM)
  
  Surface Potential Microscopy (SPoM)
  
  TappingMode/ Non-Contact
  
  Tip Enhanced Raman Spectroscopy (TERS)
  
  Torsional Resonance (TR)
  
  Tunneling AFM (TUNA)
  Accessories
  
  By AFM Accessory
  
  Dimension Accessories
  
  Innova™ Accessories
  
  MultiMode® Accessories
  
  For All AFMs Accessories
  
  Legacy AFM Accessories
  
  Accessory Type
  
  Calibration Grids
  
  Probe Holders
  
  Test Samples
  
  Misc. Accessories
  Probe Types
  
  Value Line Probes
  
  Popular Probes
  
  New Probes
  
  Unique Probes
  
  High-Performance Probes
  
  AAFM Probes
News
Support
Contact

+1 (800) 715-8440 +1 (800) 715-8440

AFM → Non-Bruker AFM

Non-Bruker AFM

Filter Your Search

Category

Probes (89)

Application

Electrical (27)
Electrochemistry (2)
Fluid Imaging (15)
General Topography (56)
Holes/ Trenches (6)
Mechanical Force Curves (31)
Mechanical Property Mapping (16)
Pulling (14)
Ultra Hi-Res (5)

Mode

Conductive AFM (CAFM) (14)
Contact Mode (35)
Contact Resonance (1)
Electrical Spectroscopy (13)
Electrostatic Force Microscopy (EFM) (17)
FASTForce Volume (4)
Force Modulation (11)
Force Spectroscopy (15)
Lateral Force Microscopy (LFM) (4)
Magnetic Force Microscopy (MFM) (5)
NanoIndentation (6)
PeakForce QNM (12)
PeakForce Tapping (8)
PeakForce TUNA (5)
Piezoresponse/ Piezoforce Microscopy (PFM) (13)
Scanning Capacitance Mode (SCM) (7)
Scanning Electrochemical Potential Microscopy (SECPM) (2)
Scanning Spreading Resistance Mode (SSRM) (5)
Scanning Tunneling Microscopy (STM) (6)
Surface Potential Microscopy (SPoM) (14)
TappingMode/ Non-Contact (51)
Torsional Resonance (TR) (5)
Tunneling AFM (TUNA) (14)

Sample

Bio Molecules (5)
Cells (12)
Ceramics (23)
Data Storage (32)
Other Hard Samples (68)
Other Soft Sample (67)
Polymers (69)
Semiconductors (41)

Probe Manufacturers

Adama Innovations (4)
Bruker (84)
Olympus (3)
Rocky Mountain Nanotechnology (4)

AFM

Anasys (2)
BioScope (61)
Dimension IconIR 300 (4)
Dimension IconIR (4)
BioScope Catalyst (65)
BioScope Resolve (13)
Caliber (86)
CellHesion (9)
Dimension FastScan (26)
Dimension Icon (93)
Dimension XR (93)
Dimension (Other) (92)
EnviroScope (71)
ForceRobot (8)
Innova (90)
Insight (24)
MultiMode (93)
NanoRacer (4)
NanoWizard 4XP & V (29)
NanoWizard ULTRA Speed (27)
NEOS/ Senterra (5)
Non-Bruker AFM (95)
Vx and UVx (36)

Spring Constant

0.05-1 N/m (29)
1-15 N/m (27)
15-50 N/m (28)
50 N/m & up (5)

Resonant Frequency

0-51 kHz (33)
51-100 kHz (25)
101-200 kHz (13)
201-400 kHz (21)
401-600 kHz (3)

Tip Radius

Ultrasharp <2nm inclusive (5)
Sharp 3nm-10nm (45)
Medium 11nm-50nm (21)
Large >50nm (4)

Cantilever Geometry

Rectangular & Triangular (7)
Rectangular (74)
Special (7)
Triangular (7)

Cantilever Coating

(47)
Reflective Aluminum (12)
Reflective Gold (11)

Tip Geometry

(2)
Conical (1)
High Aspect Ratio (5)
Pyramidal (3)
Pyramidial (1)
Rotated (Symmetric) (31)
Rotated (6)
Solid Wire (10)
Standard (Steep) (24)
Standard (4)
Super Sharp (1)
Tetrahedral (1)
Tipless (4)
Visible Apex (2)

Tip Coating

(79)
Conductive Diamond (2)
Conductive PtSi (1)
Gold (1)
Highly conductive single crystal diamond (4)
Magnetic (4)
none (1)
PtIr (2)

Number of Cantilevers

1 (79)
3 (2)
4 (7)
6 (7)

«
1
2
3
4
…
7
»

Sort By

Items per Page

High Performance

Frequency

Nom: 75KHz

Spring Const.

Nom: 3.0N/m

Geometry

Rectangular

Tip Radius

35nm

Material

0.01 - 0.025 Ωcm Antimony (n) doped Si

Coating

Magnetic

F: Magnetic CoCr

B: Reflective CoCr

Frequency

Nom: 300KHz

Spring Const.

Nom: 40N/m

Geometry

Rectangular

Tip Radius

8nm

Material

0.01 - 0.025 Ωcm Antimony (n) doped Si

Quantity

+

-

Frequency

Nom: 75KHz

Spring Const.

Nom: 2.8N/m

Geometry

Rectangular

Tip Radius

8nm

Material

0.01 - 0.025 Ωcm Antimony (n) doped Si

Coating

B: Reflective Aluminum

Frequency

Nom: 320KHz

Spring Const.

Nom: 42N/m

Geometry

Rectangular

Tip Radius

2nm

Material

0.01 - 0.025 Ωcm Antimony (n) doped Si

Frequency

Nom: 65KHz

Spring Const.

Nom: 0.35N/m

Geometry

A Triangular

Tip Radius

30nm

Material

Silicon Nitride

Coating

Gold

F: Gold

B: Reflective Gold

Frequency

Nom: 320KHz

Spring Const.

Nom: 40N/m

Geometry

Rectangular

Tip Radius

8nm

Material

0.01 - 0.025 Ωcm Antimony (n) doped Si

Frequency

Nom: 450KHz

Spring Const.

Nom: 80N/m

Geometry

Rectangular

Tip Radius

100nm

Material

0.010-0.025 Ωcm Antimony (n) doped Si

Coating

Conductive Diamond

F: Conductive Diamond

B: Reflective Aluminum

Quantity

+

-

High Performance

Frequency

Nom: 75KHz

Spring Const.

Nom: 2.8N/m

Geometry

Rectangular

Tip Radius

15nm

Material

0.01 - 0.025 Ocm Antimony (n) doped Si

Coating

Conductive PtSi

F: Conductive PtSi

B: Reflective Al

Quantity

+

-

Frequency

Nom: 320KHz

Spring Const.

Nom: 42N/m

Geometry

Rectangular

Tip Radius

10nm

Material

0.01 - 0.025 Ωcm Antimony (n) doped Si

Coating

B: Reflective Aluminum

Frequency

Nom: 75KHz

Spring Const.

Nom: 2.8N/m

Geometry

Rectangular

Tip Radius

25nm

Material

0.01 - 0.025 Ocm Antimony (n) doped Si

Coating

F: Conductive PtIr

B: Reflective PtIr

Frequency

Nom: 13KHz

Spring Const.

Nom: 0.2N/m

Geometry

Rectangular

Tip Radius

8nm

Material

0.01 - 0.025 Ωcm Antimony (n) doped Si

Coating

B: Reflective Aluminum

Quantity

+

-

Frequency

Nom: 75KHz

Spring Const.

Nom: 3.0N/m

Geometry

Rectangular

Tip Radius

25nm

Material

0.01 - 0.025 Ωcm Antimony (n) doped Si

Coating

Magnetic

F: Magnetic CoCr

B: Reflective CoCr

«
1
2
3
4
…
7
»

Subscribe for Email Updates

Hear about new products, seasonal discounts and promotions.

Full Name

Email*

Please verify your request*

Customer Service
Contact Us
Order Tracking
Your Account

Store Policies & Info
Shipping
Returns
FAQs
Terms & Conditions
Privacy Policy
Cookie Policy

Helpful Links
About Us
Site Map

Payment Methods

© 2026 Bruker AFM Probes, All Rights Reserved.

Shopping Cart: 0 Items

Your shopping cart is currently empty.

Qty Disc:

Total: $0.00 (USD)

Request Quote

Loading...