Sample

Application

Mode

AFM

Resonant Frequency:

kHz

Spring Constant:

N/m

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PEAKFORCE-HIRS-F-A

The world's first probe targeted at delivering high resolution on molecular lattices.- Ultra-sharp

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FMV-A

Product Description:

A pack of Silicon Probes.
Quantity=10

Bruker's Value Line of soft TappingMode™ and Force Modulation probes, with reflective coating. This probe is also available without Aluminum reflex coating as model FMV.

Specifications:
- 2.8N/m, 75kHz, Al Reflective Coating.
- Unmounted for use on any AFM.

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Model	Instrument	Mount	Pack Size	Price	Pack Quantity
FMV-A	All	Unmounted	10	$205.00 (USD)

Quantity discounts available

Qty	Price/Pack
2-4	$194.75 (USD)
5-37	$178.35 (USD)
38+	$139.40 (USD)

Shape	Resonant Freq. kHz			Spring Const. N/m			Length µm			Width µm
Shape	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.
Rectangular	75	50	100	2.8	1	5	230	225	235	33	28	38

Tip Specification

Tip Schematic

Geometry:	Standard (Steep)
Tip Height (h):	10 - 15µm
Front Angle (FA):	25 ± 2.5º
Back Angle (BA):	15 ± 2.5 º
Side Angle (SA):	22.5 ± 2.5 º
Tip Radius (Nom):	8 nm
Tip SetBack (TSB)(Nom):	11.5 µm
Tip Set Back (TSB)(RNG):	8-15 µm

Cantilever Specification

The Aluminum reflective coating on the back of the cantilever increases the laser signal by 2.5 times. For general imaging, it is typically not necessary to have a reflective coating. Reflective coatings are recommended for thin cantilevers, very reflective samples, and machine vision applications.

Cantilever schematic

Material:	0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry:	Rectangular
Cantilevers Number:	1
Cantilever Thickness (Nom):	2.75 µm
Cantilever Thickness (RNG):	2.0 - 3.5 µm
Back Side Coating:	Reflective Aluminum