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Tip Radius (nm)
Nom: 8
Frequency (KHz)
Nom: 13
Min: 10
Max: 16
Length (µm)
Nom: 450
Min: 495
Max: 405
Spring Const (N/m)
Nom: 0.2
Min: 0.1
Max: 0.4
Width (µm)
Nom: 50
Min: 45
Max: 55
Order a free CONTV-A sample
Price: $215.25 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
A pack of Silicon Probes.

Bruker's Value Line of Contact Mode in air ONLY probes, with reflective coating.  This probe is also available without  Aluminum reflex coating as model CONTV.

- 0.2N/m, 13kHz, Al Reflective Coating.
- Unmounted for use on any AFM.
Tip Specification
CONTV-A Tip Image
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
CONTV-A Cantilever Image
The Aluminum reflective coating on the back of the cantilever increases the laser signal by 2.5 times. For general imaging, it is typically not necessary to have a reflective coating. Reflective coatings are recommended for thin cantilevers, very reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2µm
Cantilever Thickness (RNG): 1.5 - 2.5µm
Back Side Coating: Reflective Aluminum