Skip to Main Content

Close

Account

Your Account
Login
Orders

0

Products
- Probes
  
  View All Probes
  
  AFM-IR
  
  Conductive AFM (CAFM)
  
  Contact Mode
  
  Contact Resonance
  
  Critical Dimension (CD) AFM
  
  Current In-Plane Tunneling (CIPT)
  
  Deep Trench (DT)
  
  Electrical Spectroscopy
  
  Electrostatic Force Microscopy (EFM)
  
  Fast Scan
  
  FASTForce Volume
  
  Force Modulation
  
  Force Spectroscopy
  
  HarmoniX
  
  Lateral Force Microscopy (LFM)
  
  Magnetic Force Microscopy (MFM)
  
  NanoIndentation
  
  Nanoscale Thermal Analysis
  
  PeakForce Deep Trench
  
  PeakForce QNM
  
  PeakForce QNM High-Accuracy
  
  PeakForce Tapping
  
  PeakForce TUNA
  
  Piezoresponse/ Piezoforce Microscopy (PFM)
  
  ScanAsyst
  
  Scanning Capacitance Mode (SCM)
  
  Scanning Electrochemical Potential Microscopy (SECPM)
  
  Scanning Microwave Impedance Microscopy (sMIM)
  
  Scanning Spreading Resistance Mode (SSRM)
  
  Scanning Tunneling Microscopy (STM)
  
  Surface Potential Microscopy (SPoM)
  
  TappingMode/ Non-Contact
  
  Tip Enhanced Raman Spectroscopy (TERS)
  
  Torsional Resonance (TR)
  
  Tunneling AFM (TUNA)
  Accessories
  
  By AFM Accessory
  
  Dimension Accessories
  
  Innova™ Accessories
  
  MultiMode® Accessories
  
  For All AFMs Accessories
  
  Legacy AFM Accessories
  
  Accessory Type
  
  Calibration Grids
  
  Probe Holders
  
  Test Samples
  
  Misc. Accessories
  Probe Types
  
  Value Line Probes
  
  Popular Probes
  
  New Probes
  
  Unique Probes
  
  High-Performance Probes
  
  AAFM Probes
News
Support
Contact

+1 (800) 715-8440 +1 (800) 715-8440

Mode

Mode

Filter Your Search

Category

Probes (177)
Accessories (1)

Application

Chemical Composition (2)
Electrical (33)
Electrochemistry (2)
Fluid Imaging (23)
General Topography (76)
Holes/ Trenches (32)
Mechanical Force Curves (40)
Mechanical Property Mapping (32)
Pulling (15)
Thermal (2)
Ultra Hi-Res (12)

Mode

AFM-IR (7)
Chemical Force Microscopy (CFM) (5)
Conductive AFM (CAFM) (16)
Contact Mode (44)
Contact Resonance (3)
Critical Dimension (CD) AFM (17)
Current In-Plane Tunneling (CIPT) (13)
Deep Trench (DT) (12)
Electrical Spectroscopy (13)
Electrostatic Force Microscopy (EFM) (17)
Fast Scan (7)
FASTForce Volume (4)
Force Modulation (11)
Force Spectroscopy (24)
HarmoniX (1)
Lateral Force Microscopy (LFM) (4)
Magnetic Force Microscopy (MFM) (6)
NanoIndentation (9)
nanoIR (9)
Nanoscale Thermal Analysis (11)
PeakForce Deep Trench (3)
PeakForce QNM High-Accuracy (4)
PeakForce QNM (25)
PeakForce Tapping (22)
PeakForce TUNA (6)
Piezoresponse/ Piezoforce Microscopy (PFM) (13)
ScanAsyst (11)
Scanning Capacitance Mode (SCM) (9)
Scanning Electrochemical Potential Microscopy (SECPM) (2)
Scanning Microwave Impedance Microscopy (sMIM) (2)
Scanning Spreading Resistance Mode (SSRM) (5)
Scanning Tunneling Microscopy (STM) (9)
Surface Potential Microscopy (SPoM) (15)
TappingMode/ Non-Contact (61)
Tip Enhanced Raman Spectroscopy (TERS) (2)
Torsional Resonance (TR) (5)
Tunneling AFM (TUNA) (14)

Sample

Bio Molecules (15)
Cells (23)
Ceramics (33)
Data Storage (60)
Other Hard Samples (115)
Other Soft Sample (104)
Polymers (97)
Semiconductors (76)

Probe Manufacturers

Adama Innovations (4)
Bruker (152)
Nanotools (2)
Olympus (3)
Prime Nano Inc (2)
Rocky Mountain Nanotechnology (4)
SmartTip (18)
Team Nanotech (14)

AFM

AFM-IR (7)
Anasys (6)
BioScope (67)
Dimension IconIR 300 (10)
Dimension IconIR (11)
SmartProber CIPT (1)
BioScope Catalyst (80)
BioScope Resolve (26)
Caliber (88)
CellHesion (15)
Dimension FastScan (37)
Dimension Icon (118)
Dimension XR (118)
Dimension (Other) (95)
EnviroScope (70)
ForceRobot (14)
Innova (93)
Insight (46)
MultiMode (112)
NanoRacer (16)
NanoWizard 4XP & V (46)
NanoWizard ULTRA Speed (46)
NEOS/ Senterra (5)
Non-Bruker AFM (92)
Vx and UVx (50)

Spring Constant

0.05-1 N/m (69)
1-15 N/m (40)
15-50 N/m (53)
50 N/m & up (10)

Resonant Frequency

0-51 kHz (71)
51-100 kHz (49)
101-200 kHz (22)
201-400 kHz (49)
401-600 kHz (6)
601 kHz + (2)

Tip Radius

Ultrasharp <2nm inclusive (15)
Sharp 3nm-10nm (59)
Medium 11nm-50nm (53)
Large >50nm (21)

Cantilever Geometry

(20)
Paddle (2)
Rectangular & A-frame (6)
Rectangular & Triangular (7)
Rectangular (124)
Special (23)
Triangular (17)

Cantilever Coating

(71)
Reflective Aluminum (37)
Reflective Gold (22)
Reflective Platinum/ Iridium (2)

Tip Geometry

(23)
Conical (4)
Critical Dimension (Overhang) (13)
High Aspect Ratio (6)
Inverted Pyramidal (2)
Post (1)
Pyramid (2)
Pyramidal (12)
Pyramidial (1)
Rotated (pyramidal) (1)
Rotated (Symmetric) (54)
Rotated Pyramidal (2)
Rotated (13)
Round, Overhang (3)
Solid Wire (13)
Standard (Steep) (28)
Standard (5)
Super Sharp (1)
Tetrahedral (1)
Tipless (4)
Triangular (5)
Visible Apex (5)

Tip Coating

(149)
Amorphous Carbon (3)
Au 50 nm (7)
Au (7)
Carbon (2)
Conductive Diamond (4)
Conductive PtSi (1)
Gold (1)
Highly conductive single crystal diamond (4)
Magnetic (4)
none (1)
None (4)
Platinum/ Iridium (1)
Pt (6)
PtIr (2)
Ti/Au (1)
TiW (2)

Number of Cantilevers

(22)
10 (1)
1 (154)
3 (2)
4 (7)
6 (13)

«
1
…
11
12
13
14
»

Sort By

Items per Page

MLCT-SPH-1UM-DC

Frequency

Nom: 18.0KHz

Spring Const.

Nom: 0.080N/m

Geometry

A A-frame

Tip Radius

1,000nm

Material

Silicon Nitride

Coating

B: Reflective Gold

Quantity

+

-

CALL TO ORDER

High Performance

Frequency

Nom: 320KHz

Spring Const.

Nom: 42N/m

Geometry

Rectangular

Tip Radius

8.0nm

Material

Single Crystal Si

Coating

F: Optional

B: Aluminum

CALL TO ORDER

CALL TO ORDER

High Performance

Frequency

Nom: 320KHz

Spring Const.

Nom: 42N/m

Geometry

Rectangular

Tip Radius

8.0nm

Material

Single Crystal Si

Coating

F: Optional

B: Aluminum

CALL TO ORDER

CALL TO ORDER

12 degree empty probes cassette for Bruker Insight automated AFM. Has slots that hold up to 25 probes.

CALL TO ORDER

CALL TO ORDER

High Performance

CALL TO ORDER

CALL TO ORDER

High Performance

Frequency

Nom: 300KHz

Spring Const.

Nom: 40N/m

Geometry

Rectangular

Material

Single Crystal Si

Coating

F: Optional

B: Aluminum

CALL TO ORDER

High Performance

Frequency

Nom: 55KHz

Spring Const.

Nom: 0.25N/m

Geometry

Special

Tip Radius

2nm

Material

Silicon Nitride

Coating

B: Reflective Al

Quantity

+

-

High Performance

Frequency

Nom: 300KHz

Spring Const.

Nom: 40N/m

Geometry

Rectangular

Material

Single Crystal Si

Coating

F: Optional

B: Reflective Al

CALL TO ORDER

High Performance

Frequency

Nom: 375KHz

Spring Const.

Nom: 0.35N/m

Geometry

Special

Tip Radius

8nm

Material

Silicon Nitride

Coating

B: Reflective Gold

Quantity

+

-

High Performance

Frequency

Nom: 300KHz

Spring Const.

Nom: 40N/m

Geometry

Rectangular

Material

Single Crystal Si

Coating

Carbon

F: Optional

B: Reflective Al

CALL TO ORDER

«
1
…
11
12
13
14
»

Subscribe for Email Updates

Hear about new products, seasonal discounts and promotions.

Full Name

Email*

Please verify your request*

Customer Service
Contact Us
Order Tracking
Your Account

Store Policies & Info
Shipping
Returns
FAQs
Terms & Conditions
Privacy Policy
Cookie Policy

Helpful Links
About Us
Site Map

Payment Methods

© 2026 Bruker AFM Probes, All Rights Reserved.

Shopping Cart: 0 Items

Your shopping cart is currently empty.

Qty Disc:

Total: $0.00 (USD)

Request Quote

Loading...