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Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
The Standard Probe is available on either a ceramic carrier, as is the case for the CER-2M-007, or on the PCB carrier for SmartProber Instruments. Other options include either a Au coating or a Pt coating on the pins.  Pt coating probes have higher lifetimes than that Au, at the cost of a higher contact resistance.



Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Standard Ceramic Pt  1.5 μm 18.5 μm

Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
9.6 9.3 4.5 3 1.5 1.5 1.5 1.5 5 5.7 12.4

Tip Specification
CER-2M-007 Tip Image
Cantilever Specification
CER-2M-007 Cantilever Image