Skip to Main Content


Tip Radius (nm)
Nom: 5
Max: 12
Frequency (KHz)
Nom: 1400
Min: 800
Max: 2000
Length (µm)
Nom: 27
Min: 24
Max: 30
Spring Const (N/m)
Nom: 18.0
Min: 10.0
Max: 25.0
Width (µm)
Nom: 33
Min: 30
Max: 36
Price: $935.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting

This is a gold reflex coated version of FASTSCAN-A probes.

FastScan-A-G probes are designed specifically for imaging on the Dimension FastScan AFM.  They deliver extreme imaging speed without loss of resolution, loss of force control, or added complexity. 

With the ability to perform 20x to 100x faster scans, these probes provide users with more high-quality data at a considerably faster rate, with little added operational cost. 

The FastScan-A cantilevers utilize a novel 27 um long triangular Silicon Nitride cantilever to achieve a 1400 kHz resonant frequency with only a 17 N/m force constant.  The Silicon tip has an extremely sharp 5 nm tip radius, making it ideal for imaging a wide variety of hard and soft materials.

All FastScan cantilevers have less that 3 degrees of cantilever bend.  Using this probe on an AFM other than the Dimension FastScan is not recommended and will result in sub-optimal performance.


Download the datasheet for more information.


Tip Specification
Tip Height (h): 2.5 - 8 µm
Cantilever Specification
FASTSCAN-A -G Cantilever Image
Material: Silicon Nitride
Geometry: Triangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 0.58µm
Cantilever Thickness (RNG): 0.53 - 0.63µm
Back Side Coating: Ti/Au