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Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
The Nano Probe is available with Pt coating on the pins, on either a ceramic carrier, as is the case for the CER-2M-008, or on the PCB carrier for SmartProber Instruments.



Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Standard Ceramic Pt  0.75 μm 5.87 μm

Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
2.25 1.5 0.75 0.75 0.75 0.75 1.443 1.036 1.852 3.124 3.395

Tip Specification
CER-2M-008 Tip Image
Cantilever Specification
CER-2M-008 Cantilever Image