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Tip Radius (nm)
Nom: 15.0
Max: 30.0
Frequency (KHz)
Nom: 30
Min: 10
Max: 50
Length (µm)
Nom: 345
Min: 335
Max: 355
Spring Const (N/m)
Nom: 0.35
Min: 0.05
Max: 0.65
Width (µm)
Nom: 15
Min: 13
Max: 16
Price: $2,520.00 (USD)
Sold in packs of 5
Questions? Free, Online Consulting

The AN-2 probes are designed for nano-TA. The 300 micron long probes are more optimized for contact mode. The probes come pre-mounted to larger mounts to make handling and the electrical connection easy and reliable. The probes are supplied in boxes of 5 probes as the minimum quantity.

Tip Specification
Single Crystal Si
Tip Height (h): 5.0 µm
Front Angle (FA): 17.5 ± 2.5º
Back Angle (BA): 25.0 ± 2.5º
Side Angle (SA): 20.0 ± 2.5º
Cantilever Specification
AN2-300 Cantilever Image
Material: Single Crystal Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.2µm
Cantilever Thickness (RNG): 1.8 - 2.6µm
Back Side Coating: Optional Reflective Film to increase signal