Skip to Main Content
Close
0
Probes → Probes Application Selector Guide

Probes Application Selector Guide

Probes Application Selector Guide - Download PDF

RTESPA-525
Frequency
Nom: 525KHz
Spring Const.
Nom: 200N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
TESP-SS
Frequency
Nom: 320KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
2nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
FASTSCAN-A
Frequency
Nom: 1400KHz
Spring Const.
Nom: 18N/m
Geometry
Triangular
Tip Radius
5nm
Material
Silicon Nitride
Coating
B: Reflective Aluminum
MLCT-BIO
Frequency
Nom: 22KHz
Spring Const.
Nom: 0.07N/m
Geometry
A Triangular
Tip Radius
20nm
NPG-10
Frequency
Nom: 65KHz
Spring Const.
Nom: 0.35N/m
Geometry
A Triangular
Tip Radius
30nm
Material
Silicon Nitride
Coating
Gold
F: Gold
B: Reflective Gold
FASTSCAN-B
Frequency
Nom: 450KHz
Spring Const.
Nom: 1.8N/m
Geometry
Triangular
Tip Radius
5nm
Material
Silicon Nitride
Coating
B: Reflective Gold
NCHV
Frequency
Nom: 320KHz
Spring Const.
Nom: 40N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
DTT10
DDESP-V2
Frequency
Nom: 450KHz
Spring Const.
Nom: 80N/m
Geometry
Rectangular
Tip Radius
100nm
Material
0.010-0.025 Ωcm Antimony (n) doped Si
Coating
Conductive Diamond
F: Conductive Diamond
B: Reflective Aluminum
PT10
DPT10
OBL-10
Frequency
Nom: 37KHz
Spring Const.
Nom: 0.03N/m
Geometry
A Rectangular
Tip Radius
30nm
Material
Silicon Nitride
Coating
Gold
F: Gold
B: Reflective Gold
TT10
PFTUNA
Frequency
Nom: 70KHz
Spring Const.
Nom: 0.4N/m
Geometry
Triangular
Tip Radius
25nm
Material
Silicon Nitride
Coating
Platinum/ Iridium
F: Conductive Pt/ Ir
B: Reflective Pt/ Ir
OLTESPA-R3
Frequency
Nom: 70KHz
Spring Const.
Nom: 2N/m
Geometry
Rectangular
Tip Radius
7nm
Material
0.01 - 0.02 Ωcm Silicon
Coating
B: Reflective Aluminum
© 2022 Bruker AFM Probes, All Rights Reserved.
Loading...