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Tip Radius (nm)
Nom: 5
Max: 12
Frequency (KHz)
Nom: 1400
Min: 800
Max: 2000
Length (µm)
Nom: 27
Min: 24
Max: 30
Spring Const (N/m)
Nom: 18
Min: 10
Max: 25
Width (µm)
Nom: 33
Min: 30
Max: 36
Order a free FASTSCAN-A sample
Price: $935.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting

FASTSCAN-A probes deliver extreme imaging speed without loss of resolution or force control!

Designed specifically for use with the Dimension FastScan AFM but can be used on other high speed AFM systems.

Perform high resolution imaging and collect best quality data at line rates up to 20Hz. Scan up tp 100Hz on suitably flat samples.


FASTSCAN-A probes use a novel ~30um triangular SiN lever with a high 1.4MHz frequency but just a 17N/m spring constant meaning wide compatibility with multiple sample types from polymers to semiconductor samples. A 5nm tip radius is optimally balanced for great resolution and longevity.

Download the datasheet for more information.

Tip Specification
Tip Height (h): 2.5 - 8 µm
Front Angle (FA): 15 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 17.5º
Cantilever Specification
FASTSCAN-A Cantilever Image
Material: Silicon Nitride
Geometry: Triangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 0.58µm
Cantilever Thickness (RNG): 0.53 - 0.63µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 100 ± 10 nm of Al