FASTSCAN-A
Please note that we are only able to offer samples for shipping addresses within the United States of America.
FASTSCAN-A probes deliver extreme imaging speed without loss of resolution or force control!
Designed specifically for use with the Dimension FastScan AFM but can be used on other high speed AFM systems.
Perform high resolution imaging and collect best quality data at line rates up to 20Hz. Scan up tp 100Hz on suitably flat samples.
FASTSCAN-A probes use a novel ~30um triangular SiN lever with a high 1.4MHz frequency but just a 17N/m spring constant meaning wide compatibility with multiple sample types from polymers to semiconductor samples. A 5nm tip radius is optimally balanced for great resolution and longevity.
Download the datasheet for more information.



