Home → Product
Easy Product Wizard
kHz
N/m
Search Products Clear selection

FASTSCAN-A

Product Description:

FastScan-A probes are designed specifically for imaging in air on the Dimension FastScan AFM.  They deliver extreme imaging speed without loss of resolution, loss of force control, or added complexity. 

With the ability to perform 20x to 100x faster scans, these probes provide users with more high-quality data at a considerably faster rate, with little added operational cost. 

The FastScan-A cantilevers utilize a novel 27 um long triangular Silicon Nitride cantilever to achieve a 1400 kHz resonant frequency with only a 17 N/m force constant.  The Silicon tip has an extremely sharp 5 nm tip radius, making it ideal for imaging a wide variety of hard and soft materials.

All FastScan cantilevers have less that 3 degrees of cantilever bend.  Using this probe on an AFM other than the Dimension FastScan is not recommended and will result in sub-optimal performance.

In July 2015 Bruker implemented a new process to achieve higher quality and consistency in this probe's physical appearance and dimensions.  Our goal is to provide improved user results in consistency of rendered resolution and less variation to instrument settings.  We would like to hear your feedback on how these improvements have affected your results.  Please contact us and let us know!

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
FASTSCAN-A Dimension FastScan™ Unmounted 10 $690.00 (USD)

Quantity discounts available

QtyPrice/Pack
2-6$621.00 (USD)
7-15$586.50 (USD)
16-24$552.00 (USD)
25-37$517.50 (USD)
38+$483.00 (USD)



Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Triangular 1400 800 2000 18 10 25 27 24 30 33 30 36

Tip Specification

Geometry: Rotated (Symmetric)
Tip Height (h): 2.5 - 8µm
Front Angle (FA): 15 ± 2.5º
Back Angle (BA): 25 ± 2.5 º
Side Angle (SA): 17.5 º
Tip Radius (Nom): 5 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 5 µm
Tip Set Back (TSB)(RNG): 0 - 7 µm

Cantilever Specification

Material: Silicon Nitride
Geometry: Triangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 0.58 µm
Cantilever Thickness (RNG): 0.53 - 0.63 µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 100 ± 10 nm of Al
Optional Product Offerings
FASTSCAN-D-SS
New super sharp probe for highest resolution imagi...
Details | Shop
FASTSCAN-B
FastScan-B probes are designed specifically for im...
Details | Shop
FASTSCAN-C
FastScan-C probes are designed specifically for im...
Details | Shop
FASTSCAN-D
 The latest addition to the cost effective FASTSCA...
Details | Shop