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Tip Radius (nm)
Nom: 25
Max: 35
Frequency (KHz)
Nom: 70
Min: 45
Max: 95
Length (µm)
Nom: 115
Min: 130
Max: 100
Spring Const (N/m)
Nom: 0.4
Min: 0.2
Max: 0.8
Width (µm)
Nom: 25
Min: 20
Max: 30
Order a free PFTUNA sample
Price: $514.50 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
PFTUNA probes combine the low spring constant and high sensitivity of a nitride cantilever with a sharp, electrically conductive tip.  When used with Brukers exclusive PeakForce TUNA mode, they enable an unprecedented level of high resolution electrical characterization on fragile samples.

Tip Specification
PFTUNA Tip Image
Tip Height (h): 2.5 - 8 µm
Front Angle (FA): 15 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 17.5 ± 2.5º
Cantilever Specification
PFTUNA Cantilever Image
PFTUNA probes have less than 3deg of cantilever bend.
Material: Silicon Nitride
Geometry: Triangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 0.65µm
Cantilever Thickness (RNG): 0.6 - 0.7µm
Back Side Coating: Reflective Pt/ Ir