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Tip Radius (nm)
Nom: 5
Max: 12
Frequency (KHz)
Nom: 450
Min: 300
Max: 600
Length (µm)
Nom: 30
Min: 27
Max: 33
Spring Const (N/m)
Nom: 1.8
Min: 1
Max: 3
Width (µm)
Nom: 33
Min: 30
Max: 36
Order a free FASTSCAN-B sample
Price: $935.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting

FASTSCAN-B probes deliver fantastic imaging speed without loss of resolution or force control!

Designed specifically for use with the Dimension FastScan AFM but can be used on other high speed AFM systems.


FASTSCAN-B probes use a novel ~30um triangular SiN lever with a moderately high 450kHz frequency and just a ~2N/m spring constant, meaning wide compatibility with multiple sample types. A 5nm tip radius is optimally balanced for great resolution and longevity. These probes are typically used on softer samples than FASTSCAN-A probes.


Download the datasheet for more information.

Tip Specification
Tip Height (h): 2.5 - 8 µm
Front Angle (FA): 15 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 17.5 ± 2.5º
Cantilever Specification
FASTSCAN-B Cantilever Image
Material: Silicon Nitride
Geometry: Triangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 0.3µm
Cantilever Thickness (RNG): 0.25 - 0.35µm
Back Side Coating: Reflective Gold
Top Layer Back: 60 ± 10 nm of Ti/Au