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Tip Radius (nm)
Nom: 5
Max: 12
Frequency (KHz)
Nom: 300
Min: 200
Max: 400
Length (µm)
Nom: 42
Min: 39
Max: 45
Spring Const (N/m)
Nom: 0.8
Min: 0.4
Max: 1.2
Width (µm)
Nom: 40
Min: 38
Max: 42
Order a free FASTSCAN-C sample
Price: $935.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting

FastScan-C probes are designed specifically for imaging in fluid on the Dimension FastScan AFM.  They deliver extreme imaging speed without loss of resolution, loss of force control, or added complexity. 

With the ability to perform 20x to 100x faster scans, these probes provide users with more high-quality data at a considerably faster rate, with little added operational cost. 

The FastScan-C cantilevers utilize a novel 40 um long triangular Silicon Nitride cantilever to achieve a 300 kHz resonant frequency with only a 0.8 N/m force constant.  The Silicon tip has an extremely sharp 5 nm tip radius, making it ideal for imaging a wide variety of hard and soft materials.

All FastScan cantilevers have less than 3 degrees of cantilever bend.  Using this probe on an AFM other than the Dimension FastScan is not recommended and will result in sub-optimal performance.


Download the datasheet for more information.

Tip Specification
Tip Height (h): 2.5 - 8 µm
Front Angle (FA): 15 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 17.5 ± 2.5º
Cantilever Specification
FASTSCAN-C Cantilever Image
Material: Silicon Nitride
Geometry: Triangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 0.3µm
Cantilever Thickness (RNG): 0.25 - 0.35µm
Back Side Coating: Reflective Gold
Top Layer Back: 60 ± 10 nm of Ti/Au