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TESPA-V2

TESPA-V2
Geometry
Rectangular
Tip Radius (nm)
Nom: 7
Max: 10
Frequency (KHz)
Nom: 320
Min: 270
Max: 370
Length (µm)
Nom: 123
Min: 120
Max: 125
Spring Const (N/m)
Nom: 37
Min: 19
Max: 55
Width (µm)
Nom: 40
Min: 37
Max: 42
3 Total Related Products
TESP-V2

 

 

 

 

 

A pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's. 

Bruker AFM Probes has introduced an improved version of its popular, TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPA-V2.  
View...
TESPAW-V2
A wafer of high quality, etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's.

Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premiumetched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESPW-V2.  

The current model TESPAW is available for ordering through early 2014 at which point, it will become obsolete.View...
VTESPA-300
Visible Apex Probe with highest performance and consistency.
- 42 N/m, 300 kHz
- Aluminum Reflex Coating
- 10 pack
- Also available as wafer model VTESPA-300-W

Bruker's New VTESPA-300 is the highest resolution visible apex tip on the market.

VTESPA-300 combines the advantage of a visible apex tip for feature targeting with the best measurement consistency and highest performance for TappingMode imaging.  It covers a wide range of TappingMode imaging applications and is ideal for roughness measurements, imaging IC devices, thin films, and crystal surfaces.  Key features of the probe include:

1) Visible apex tip enables AFM imaging exactly at the location targeting through the AFM optics.

2) Attains the highest consistency in AFM measurements due to industry best probe-to-probe consistency in tip radius, tip height, spring constant, and tapping frequency.

3) Designed and optimized by Bruker, the inventor of TappingMode, to achieve the highest performance TappingMode imaging.

4) Produces accurate images of rugged features, enabled by the narrow tip angle and forward pointing tip design that effectively compensates for the forward tilt of the AFM probe holder (typically 5-20 degrees).
View...
Order a free TESPA-V2 sample
Price: $378.00 (USD)
Sold in packs of 10
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Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
A pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's. 

Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESP-V2.  
Tip Specification
TESPA-V2 Tip Image
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 17.5 ± 2.5ºº
Side Angle (SA): 20 ± 2.5ºº
Cantilever Specification
TESPA-V2 Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.3µm
Cantilever Thickness (RNG): 2.8 - 3.8µm
Back Side Coating: Reflective Aluminum
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