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Tip Radius (nm)
Nom: 7
Max: 10
Frequency (KHz)
Nom: 320
Min: 270
Max: 370
Length (µm)
Nom: 123
Min: 120
Max: 125
Spring Const (N/m)
Nom: 37
Min: 19
Max: 55
Width (µm)
Nom: 40
Min: 37
Max: 42
Order a free TESPA-V2 sample
Price: $378.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting

TESPA-V2 is our best performing, best selling, non-rotated tapping mode probe! An industry standard ~300kHz, ~40N/m, ~100um long, Al coated rectangular cantilever paired with a 15um tall and 8nm radius tip. Get the best tapping mode topography and phase images on everything from polymers to ceramics, metals to semiconductors. Compatible with all AFMs.


Probe part numbers ending in -V2 provide:

Tighter dimensional specifications for improved probe to probe consistency

More precise alignment of the tip to the cantilever apex

Improved aesthetics

Tip Specification
TESPA-V2 Tip Image
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 17.5 ± 2.5ºº
Side Angle (SA): 20 ± 2.5ºº
Cantilever Specification
TESPA-V2 Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.3µm
Cantilever Thickness (RNG): 2.8 - 3.8µm
Back Side Coating: Reflective Aluminum