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TESPA-V2

TESPA-V2
Geometry
Rectangular
Tip Radius (nm)
Nom: 7
Max: 10
Frequency (KHz)
Nom: 320
Min: 270
Max: 370
Length (µm)
Nom: 123
Min: 120
Max: 125
Spring Const (N/m)
Nom: 37
Min: 19
Max: 55
Width (µm)
Nom: 40
Min: 37
Max: 42
Price: $360.00 (USD)
Sold in packs of 10
Order a free TESPA-V2 sample
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+1 (800) 715-8440
Overview
A pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's. 

Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESP-V2.  
Tip Specification
TESPA-V2 Tip Image
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 17.5 ± 2.5ºº
Side Angle (SA): 20 ± 2.5ºº
Cantilever Specification
TESPA-V2 Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.3µm
Cantilever Thickness (RNG): 2.8 - 3.8µm
Back Side Coating: Reflective Aluminum
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