TESPA-V2

TESP-V2 is our best performing, best selling, non-rotated tapping mode probe! An industry standard ~300kHz, ~40N/m, ~100um long, uncoated rectangular cantilever paired with a 15um tall and 8nm radius tip. Get the best tapping mode topography and phase images on everything from polymers to ceramics, metals to semiconductors. Compatible with all AFMs.

 

Probe part numbers ending in -V2 provide:

Tighter dimensional specifications for improved probe to probe consistency

More precise alignment of the tip to the cantilever apex

Improved aesthetics

 

Most customers buy the AL coated version for greater sum signal: TESPA-V2.  

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A wafer of high quality, etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's.

Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premiumetched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESPW-V2.  

The current model TESPAW is available for ordering through early 2014 at which point, it will become obsolete.View...