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Frequency (KHz)
Nom: 180
Min: 100
Max: 300
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 40
Min: 20
Max: 60
Width (µm)
Nom: 28
Min: 23
Max: 33
Price: $1,500.00 (USD)
Sold in packs of 5
Questions? Free, Online Consulting
Super Sharp Conductive Single Crystal Diamond Probes, 40 N/m, 180 kHz, <5 nm ROC, 5-Pack

Super sharp tip for highest resolution combined with high spring constant, suitable for higher force and harder sample applications including:

- Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.
- Electrical characterization with PeakForce TUNA, TUNA, CAFM.
- Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.
All Adama probes are now included in the Sader Method - Global Calibration Initiative.

Tip Specification
AD-40-SS Tip Image
Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm·cm. Contact resistance is typically 10 k? depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.
Tip Height (h): 12.5 ± 2.5 µm
Front Angle (FA): 25 ± 5º
Back Angle (BA): 15 ± 5º
Side Angle (SA): 22.5 ± 5º
Cantilever Specification
AD-40-SS Cantilever Image
Material: Single Crystal Diamond
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.0µm
Cantilever Thickness (RNG): 2.5 - 3.5µm
Back Side Coating: Reflective Au