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RESP-10

RESP-10
Geometry
Rectangular
Tip Radius (nm)
Nom: 8
Max: 12
Frequency (KHz)
Nom: 10
Min: 4
Max: 16
Length (µm)
Nom: 450
Min: 440
Max: 460
Spring Const (N/m)
Nom: 0.1
Min: 0.03
Max: 0.2
Width (µm)
Nom: 35
Min: 33
Max: 37
Price: $375.00 (USD)
ex vat
Sold in packs of 10
Order a free RESP-10 sample
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Overview
A pack of 10 High quality etched silicon probes for contact mode imaging in air.  Unmounted for use on standard AFM's.

Bruker's flagship RESP probes are the preferred choice for high-sensitivity silicon probe imaging in contact mode in air.  Every aspect of the RESP design has been optimized to provide the most accurate profiling of microscopic features.  With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the RESP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types. 


The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RESPA-10.

Tip Specification
RESP-10 Tip Image
This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2º
Side Angle (SA): 17.5 ± 2º
Cantilever Specification
RESP-10 Cantilever Image
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1.80µm
Cantilever Thickness (RNG): 1.05 - 2.55µm
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