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Tip Radius (nm)
Nom: 5
Max: 12
Frequency (KHz)
Nom: 300
Min: 200
Max: 400
Length (µm)
Nom: 42
Min: 39
Max: 45
Spring Const (N/m)
Nom: 0.8
Min: 0.4
Max: 1.2
Width (µm)
Nom: 40
Min: 37
Max: 43
Order a free PFQNE-AL sample
Price: $866.25 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Bruker's new PeakForce KPFM probes, 10-pack.  300 kHz, 1.5 N/m.

A 10-pack of sharp nitride lever probes ideally suited for Peak Force Quantitative Nano-Electric measurements.  These probes are tailored for specific high resolution electrical measurements by matching the softness of a nitride cantilever with the sharpness of an uncoated silicon probe.

In July 2015 Bruker implemented a new process to achieve higher quality and consistency in this probe's physical appearance and dimensions.  Our goal is to provide improved user results in consistency of rendered resolution and less variation to instrument settings.  We would like to hear your feedback on how these improvements have affected your results.  Please contact us and let us know!
Tip Specification
PFQNE-AL Tip Image
Silicon tip on Silicon Nitride cantilever.
Tip Height (h): 2.5 - 8 µm
Front Angle (FA): 15 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 17.5 ± 2.5º
Cantilever Specification
PFQNE-AL Cantilever Image
PFQNE-AL probes have less than 3deg of bend.
Material: Silicon Nitride
Geometry: Triangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 0.3µm
Cantilever Thickness (RNG): 0.25 - 0.35µm
Back Side Coating: Proprietary reflective coating