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Tip Radius (nm)
Nom: 5
Max: 12
Frequency (KHz)
Nom: 300
Min: 200
Max: 400
Length (µm)
Nom: 42
Min: 39
Max: 45
Spring Const (N/m)
Nom: 0.8
Min: 0.4
Max: 1.2
Width (µm)
Nom: 40
Min: 37
Max: 43
Order a free PFQNE-AL sample
Price: $866.25 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Bruker's PeakForce KPFM probes, 10-pack.  300 kHz, 0.8 N/m.

A 10-pack of sharp nitride lever probes ideally suited for Peak Force Quantitative Nano-Electric measurements.  These probes are tailored for specific high resolution electrical measurements by matching the softness of a nitride cantilever with the sharpness of an uncoated silicon probe.
Tip Specification
PFQNE-AL Tip Image
Silicon tip on Silicon Nitride cantilever.
Tip Height (h): 2.5 - 8 µm
Front Angle (FA): 15 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 17.5 ± 2.5º
Cantilever Specification
PFQNE-AL Cantilever Image
PFQNE-AL probes have less than 3deg of bend.
Material: Silicon Nitride
Geometry: Triangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 0.3µm
Cantilever Thickness (RNG): 0.25 - 0.35µm
Back Side Coating: Proprietary reflective coating