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Probes → PCB-2M-004

PCB-2M-004

PCB-2M-004 View Larger
2 Total Related Products
PCB-1M-004
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Narrow Probe is available on either a ceramic carrier or, as is the case for the PCB-1M-004, on the PCB carrier for SmartProber Instruments. Other options include either a Au coating or a Pt coating on the pins.  Pt coating probes have higher lifetimes than that Au, at the cost of a higher contact resistance.
 

PCB-1M-004

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Narrow PCB Au  1.5 μm 8.3 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
4.5 3 1.5 1.5 1.5 1.5 1.75 2 2.25 2.5 2.75

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PCB-2M-007
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Standard Probe is available on either a ceramic carrier or, as is the case for the PCB-2M-007, on the PCB carrier for SmartProber Instruments. Other options include either a Au coating or a Pt coating on the pins.  Pt coating probes have higher lifetimes than that Au, at the cost of a higher contact resistance.
 

PCB-2M-007

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Standard PCB Pt  1.5 μm 18.5 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
9.6 9.3 4.5 3 1.5 1.5 1.5 1.5 5 5.7 12.4

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Overview
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Narrow Probe is available on either a ceramic carrier or, as is the case for the PCB-2M-004, on the PCB carrier for SmartProber Instruments. Other options include either a Au coating or a Pt coating on the pins.  Pt coating probes have higher lifetimes than that Au, at the cost of a higher contact resistance.
 

PCB-2M-004

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Narrow PCB Pt  1.5 μm 8.3 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
4.5 3 1.5 1.5 1.5 1.5 1.75 2 2.25 2.5 2.75

Tip Specification
PCB-2M-004 Tip Image
Cantilever Specification
PCB-2M-004 Cantilever Image
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