Skip to Main Content

CER-1M-005

Questions? Free, Online Consulting
Overview
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Wide Probe is available with a Au coating on the pins, on either a ceramic carrier,as is the case for the CER-1M-005, or on the PCB carrier for SmartProber Instruments.
 

PCB-1M-005

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Wide Ceramic Au  3.0 μm 59 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
60 24 15 6 3 3 3 3 9 12 39

Tip Specification
Cantilever Specification
CER-1M-005 Cantilever Image
Loading...