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Featured Products
FASTSCAN-A
FastScan-A probes are designed specifically for imaging in air on the Dimension FastScan AFM. They
Details | Shop
Caliber™
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1550-00
Cantilever & wafer tool kit: 1 scribe, 1 wafer tweezers, 3 regular tweezers. This kit is included i...
Details
1560-00
Cantilever mounts for Caliber and Explorer. Quantity = 100.
Details
APSH-0040
The Cross-Sectional Sample Holder, 0.75" in diameter and 0.26" tall, is used when the cross-section...
Details
HOPG
HOPG is often used as a standard testing sample for Scanning Tunneling Microscopy (STM). It is a hi...
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ISGS
This Gold Sample, mounted on 15mm Puck, is for indenting/scratching applications, 8mm x 8mm in dime...
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MICA
Mica sample disks are useful as a sample substrate (especially for biological samples) and as an at...
Details
PG-STM
Calibration Artifact: 100nm Depth, 1µm Pitch, Pt Coated. This sample is identical to sample PG but ...
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PS-LDPE-12M
HarmoniX Training Sample for MultiMode and Dimension SPMs· A two-component polymer sample mounted o...
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RS
Titanium Roughness Sample. This is used with the NanoScope tip-evaluation software. Tip-evaluation ...
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SD-101
SPM sample mounting disks, steel, 12mm diameter. Qty 50.
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SD-104
SPM sample mounting disks, 6mm diameter. Qty 50.
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STKYDOT
A full package of adhesive pads for mounting samples on to steel mounting disks. These are 36 adhes...
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STOR1
Tip storage kit provides convenient storage for individual tips from whole wafers. Includes one she...
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STOR2
Tip storage kit with gel for silicon nitride cantilevers. This tip storage kit provides convenient ...
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STR10-1800P
Calibration artifact, 180nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies ha...
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STR10-180P
Calibration artifact: 18nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies hav...
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STR10-440P
Calibration artifact: 44nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies hav...
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STR3-1000P
Calibration artifact: 100nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies hav...
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STR3-1800P
Calibration artifact: 180nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies hav...
Details
STR3-180P
Calibration artifact: 18nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies have...
Details
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