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Featured Products
SAA-HPI-SS
New super sharp probes for highest resolution imaging in air on the widest sample range. Optimize
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Caliber™
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1550-00
Cantilever & wafer tool kit for all Veeco SPMs: 1 scribe, 1 wafer tweezers, 3 regular tweezers. Thi...
Details
1560-00
Cantilever mounts for Caliber and Explorer. Quantity = 100.
Details
1580-00
***This product is no longer available. Please order directly from manufacturer. http://www.maste...
Details
APSH-0040
The Cross-Sectional Sample Holder, 0.75" in diameter and 0.26" tall, is used when the cross-section...
Details
HOPG
HOPG is often used as a standard testing sample for Scanning Tunneling Microscopy (STM). It is a hi...
Details
ISGS
This Gold Sample, mounted on 15mm Puck, is for indenting/scratching applications, 8mm x 8mm in dime...
Details
MICA
Mica sample disks are useful as a sample substrate (especially for biological samples) and as an at...
Details
PG-STM
Calibration Artifact: 100nm Depth, 1µm Pitch, Pt Coated. This sample is identical to sample PG but ...
Details
PS-LDPE-12M
HarmoniX Training Sample for MultiMode and Dimension SPMs· A two-component polymer sample mounted o...
Details
RS
Titanium Roughness Sample. This is used with the NanoScope tip-evaluation software. Tip-evaluation ...
Details
SD-101
SPM sample mounting disks, steel, 12mm diameter. Qty 50.
Details
SD-104
SPM sample mounting disks, 6mm diameter. Qty 50.
Details
STKYDOT
A full package of adhesive pads for mounting samples on to steel mounting disks. These are 36 adhes...
Details
STOR1
Tip storage kit provides convenient storage for individual tips from whole wafers. Includes one she...
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STOR2
Tip storage kit with gel for silicon nitride cantilevers. This tip storage kit provides convenient ...
Details
STR10-1800P
Calibration artifact, 180nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies ha...
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STR10-180P
Calibration artifact: 18nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies hav...
Details
STR10-440P
Calibration artifact: 44nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies hav...
Details
STR3-1000P
Calibration artifact: 100nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies hav...
Details
STR3-1800P
Calibration artifact: 180nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies hav...
Details
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