My Account
|
|
Login
+1 (800) 715-8440
Home
Probes
Shop by Mode
Conductive AFM (CAFM)
Contact Mode
Contact Resonance
Critical Dimension (CD) AFM
Deep Trench (DT)
Electrical Spectroscopy
Electrostatic Force Microscopy (EFM)
Fast Scan
FASTForce Volume
Force Modulation
Force Spectroscopy
HarmoniX
Lateral Force Microscopy (LFM)
Magnetic Force Microscopy (MFM)
NanoIndentation
Nanoscale Thermal Analysis
PeakForce Deep Trench
PeakForce QNM
PeakForce QNM High-Accuracy
PeakForce Tapping
PeakForce TUNA
Piezoresponse/ Piezoforce Microscopy (PFM)
ScanAsyst
Scanning Capacitance Mode (SCM)
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Spreading Resistance Mode (SSRM)
Scanning Tunneling Microscopy (STM)
Surface Potential Microscopy (SPoM)
TappingMode/ Non-Contact
Tip Enhanced Raman Spectroscopy (TERS)
Torsional Resonance (TR)
Tunneling AFM (TUNA)
Shop by Application
Electrical
Electrochemistry
Fluid Imaging
General Topography
Holes/ Trenches
Mechanical Force Curves
Mechanical Property Mapping
Pulling
Ultra Hi-Res
Shop by AFM
BioScope
Insight
MultiMode
NEOS/ Senterra
Non-Bruker AFM
Vx and UVx
BioScope Catalyst
BioScope Resolve
Caliber
Dimension FastScan
Dimension Icon
Dimension XR
Dimension (Other)
EnviroScope
Innova
Shop by Sample
Bio Molecules
Cells
Ceramics
Data Storage
Other Hard Samples
Other Soft Sample
Polymers
Semiconductors
AFM Accessories
Shop by AFM
BioScope Catalyst
BioScope Resolve
Bioscope®
Caliber™
Dimension
EnviroScope™
For All AFMs
Innova™
MultiMode®
Shop by Accessory Type
Alignment Stands
Calibration References
Calibration Standards
Condensation Windows
Evaporation Covers
Fluid Cell Kits
Fluid Cells
MFM Tool Kits
Mounting Kits
O-Rings
Petri Dish Clamps
Probe Holders
Probe Storage Kits
Replacement Springs
Sample Holders
Splash Guards
Starter Kits
Test Samples
AFM Systems
Upgrades and Trade-Ins by AFM
Dimension Upgrade/ Trade-In
MultiMode Upgrade/ Trade-In
Quote Request
Blog
Support
AFM Probe FAQs
Bruker site
NanoScale World
Applications Selector Guide
About Bruker AFM Probes
Contact
Shopping Cart ( 0 )
Home
→
SPM Accessories
→
By AFM
→ Caliber™
Easy Product
Wizard
Sample
Bio Molecules
Cells
Ceramics
Data Storage
Other Hard Samples
Other Soft Sample
Polymers
Semiconductors
Application
Holes/ Trenches
Electrical
Electrochemistry
Fluid Imaging
Mechanical Force Curves
Mechanical Property Mapping
Pulling
General Topography
Ultra Hi-Res
Mode
Conductive AFM (CAFM)
Contact Mode
Critical Dimension (CD) AFM
Electrical Spectroscopy
Electrostatic Force Microscopy (EFM)
Fast Scan
Force Modulation
Force Spectroscopy
HarmoniX
Lateral Force Microscopy (LFM)
Magnetic Force Microscopy (MFM)
NanoIndentation
TappingMode/ Non-Contact
PeakForce QNM
PeakForce Tapping
PeakForce TUNA
Piezoresponse/ Piezoforce Microscopy (PFM)
ScanAsyst
Scanning Capacitance Mode (SCM)
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Spreading Resistance Mode (SSRM)
Nanoscale Thermal Analysis
Scanning Tunneling Microscopy (STM)
Surface Potential Microscopy (SPoM)
Torsional Resonance (TR)
Tunneling AFM (TUNA)
Deep Trench (DT)
Tip Enhanced Raman Spectroscopy (TERS)
Scanning Microwave Impedance Microscopy (sMIM)
FASTForce Volume
Contact Resonance
PeakForce Deep Trench
PeakForce QNM High-Accuracy
AFM
BioScope
BioScope Catalyst
BioScope Resolve
Caliber
Dimension XR
Dimension Icon
Dimension FastScan
Dimension (Other)
EnviroScope
Innova
Insight
MultiMode
NEOS/ Senterra
Non-Bruker AFM
Vx and UVx
Resonant Frequency:
kHz
± 50kHz
± 100kHz
± 200kHz
Spring Constant:
N/m
± 0.05 N/m
± 0.1 N/m
± 5 N/m
± 10 N/m
± 15 N/m
and Greater
and Lower
Search Products
Clear selection
Featured Products
SAA-HPI-SS
New super sharp probes for highest resolution imaging in air on the widest sample range. Optimize
Details | Shop
Caliber™
Page:1
2
1550-00
Cantilever & wafer tool kit for all Veeco SPMs: 1 scribe, 1 wafer tweezers, 3 regular tweezers. Thi...
Details
1560-00
Cantilever mounts for Caliber and Explorer. Quantity = 100.
Details
1580-00
***This product is no longer available. Please order directly from manufacturer. http://www.maste...
Details
APSH-0040
The Cross-Sectional Sample Holder, 0.75" in diameter and 0.26" tall, is used when the cross-section...
Details
HOPG
HOPG is often used as a standard testing sample for Scanning Tunneling Microscopy (STM). It is a hi...
Details
ISGS
This Gold Sample, mounted on 15mm Puck, is for indenting/scratching applications, 8mm x 8mm in dime...
Details
MICA
Mica sample disks are useful as a sample substrate (especially for biological samples) and as an at...
Details
PG-STM
Calibration Artifact: 100nm Depth, 1µm Pitch, Pt Coated. This sample is identical to sample PG but ...
Details
PS-LDPE-12M
HarmoniX Training Sample for MultiMode and Dimension SPMs· A two-component polymer sample mounted o...
Details
RS
Titanium Roughness Sample. This is used with the NanoScope tip-evaluation software. Tip-evaluation ...
Details
SD-101
SPM sample mounting disks, steel, 12mm diameter. Qty 50.
Details
SD-104
SPM sample mounting disks, 6mm diameter. Qty 50.
Details
STKYDOT
A full package of adhesive pads for mounting samples on to steel mounting disks. These are 36 adhes...
Details
STOR1
Tip storage kit provides convenient storage for individual tips from whole wafers. Includes one she...
Details
STOR2
Tip storage kit with gel for silicon nitride cantilevers. This tip storage kit provides convenient ...
Details
STR10-1800P
Calibration artifact, 180nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies ha...
Details
STR10-180P
Calibration artifact: 18nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies hav...
Details
STR10-440P
Calibration artifact: 44nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies hav...
Details
STR3-1000P
Calibration artifact: 100nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies hav...
Details
STR3-1800P
Calibration artifact: 180nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies hav...
Details
Page:1
2