Cantilever & wafer tool kit: 1 scribe, 1 wafer tweezers, 3 regular tweezers
Cantilever mounts for Caliber and Explorer
Cross-Sectional Sample Holder
Highly-ordered pyrolytic graphite, Grade ZYB
Gold Sample, on 15mm Puck
AFM sample Mica disks, 12mm
Calibration Artifact: 100nm Depth, 1µm Pitch, Pt Coated
Titanium roughness sample
Sample adhesive pads, full package
Calibration artifact: 100nm step height, 3µm pitch
Tip storage kit with gel for silicon cantilevers
Calibration artifact: 180nm step height, 3µm pitch
SPM sample mounting disks, steel, 12mm diameter
Calibration artifact: 180nm step height, 3/10/20µm pitch, NIST traceable
Calibration artifact: 18nm step height, 10µm pitch
