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Tip Radius (nm)
Nom: 8
Max: 12
Frequency (KHz)
Nom: 150
Min: 90
Max: 210
Length (µm)
Nom: 125
Min: 115
Max: 135
Spring Const (N/m)
Nom: 5
Min: 1.5
Max: 10
Width (µm)
Nom: 35
Min: 33
Max: 37
Order a free RTESPA-150 sample
Price: $404.25 (USD)
Sold in packs of 10
Questions? Free, Online Consulting


A pack of 10 High quality etched silicon probes for soft TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's.

Bruker's probes are the preferred choice for high-sensitivity silicon probe imaging in TappingMode or non-contact mode in air.  Every aspect of the probe design has been optimized to provide the most accurate profiling of microscopic features.  With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types. 

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RTESP-150Download the datasheet to learn more.


Tip Specification
RTESPA-150 Tip Image
This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2º
Side Angle (SA): 17.5 ± 2º
Cantilever Specification
RTESPA-150 Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1.75µm
Cantilever Thickness (RNG): 1.0 - 2.5µm
Back Side Coating: Reflective Aluminum