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ESPA-V2

ESPA-V2
Geometry
Rectangular
Tip Radius (nm)
Nom: 8
Max: 12
Frequency (KHz)
Nom: 13
Min: 9
Max: 17
Length (µm)
Nom: 450
Min: 440
Max: 460
Spring Const (N/m)
Nom: 0.2
Min: 0.05
Max: 0.4
Width (µm)
Nom: 50
Min: 48
Max: 52
Price: $360.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
A pack of 10 High quality etched silicon probes for contact mode imaging in air.  Unmounted for use on standard AFM's. 

Bruker AFM Probes has introduced an improved version of its popular, ESP/ESPA AFM probes. Bruker’s new line of ESP high quality premiumetched silicon probes set the industry standard for contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model ESP-V2.

Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
ESPA-V2 Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2µm
Cantilever Thickness (RNG): 1.25 - 2.75µm
Back Side Coating: Reflective Aluminum
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