ESP-V2

A pack of Silicon Probes.
Quantity=10

Bruker's Value Line of Contact Mode in air ONLY probes.  This probe is also available with an Aluminum reflex coating as model CONTV-A.

Specifications:
- 0.2N/m, 13kHz, No Reflective Coating.
- Unmounted for use on any AFM.

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A wafer High quality etched silicon probes for contact mode imaging in air.  Unmounted for use on standard AFM's.

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model ESPAW-V2.
 
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Bruker AFM Probes has introduced an improved version of its popular, ESP/ESPA AFM probes. Bruker’s new line of ESP high quality premiumetched silicon probes set the industry standard for contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model ESP-V2.

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A wafer of High quality etched silicon probes for contact mode imaging in air.  Unmounted for use on standard AFM's.

Bruker AFM Probes has introduced an improved version of its popular, ESP/ESPA AFM probes. Bruker’s new line of ESP high quality premiumetched silicon probes set the industry standard for contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model ESPW-V2.

The current model ESPW is available for ordering through early 2015 at which point, it will become obsolete.
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