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ESP-V2
Geometry
RectangularTip Radius (nm)
Nom: 8
Max: 12
Frequency (KHz)
Nom: 13
Min: 9
Max: 17
Length (µm)
Nom: 450
Min: 440
Max: 460
Spring Const (N/m)
Nom: 0.2
Min: 0.05
Max: 0.4
Width (µm)
Nom: 50
Min: 48
Max: 52
Price: $357.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
A pack of 10 High quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFMs.
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model ESPA-V2.
Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2µm
Cantilever Thickness (RNG): 1.25 - 2.75µm