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ESP-V2

Product Description:

A pack of 10 High quality etched silicon probes for contact mode imaging in air.  Unmounted for use on standard AFM's. 

Bruker AFM Probes has introduced an improved version of its popular, ESP/ESPA AFM probes. Bruker’s new line of ESP high quality premiumetched silicon probes set the industry standard for contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model ESPA-V2.

The current model ESP is available for ordering through early 2015 at which point, it will become obsolete.

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
ESP-V2 All Unmounted 10 $350.00 (USD)

Quantity discounts available

QtyPrice/Pack
2-6$297.50 (USD)
7-15$262.50 (USD)
16-24$227.50 (USD)
25-37$192.50 (USD)
38+$157.50 (USD)



Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 13 9 17 0.2 0.05 0.4 450 440 460 50 48 52

Tip Specification

Geometry: Standard (Steep)
Tip Height (h): 10 - 15µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5 º
Side Angle (SA): 22.5 ± 2.5 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 15 µm
Tip Set Back (TSB)(RNG): 5 - 25 µm

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2 µm
Cantilever Thickness (RNG): 1.25 - 2.75 µm
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