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Focused Ion beam (FIB) probes consist of an integrated single crystal silicon cantilever and tip which have been machined (or shaped) to obtain the desired aspect ratio.  They have near vertical sidewalls and aspect ratios of more than 10:1.  Common applications include semiconductor devices, 3-D micro-optics, and development of precision metrology methods.  FIB tips are designed only for TappingMode and for profiling narrow gaps.  FIB tips should not be used in contact mode.