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Tip Radius (nm)
Nom: 2
Max: 5
Frequency (KHz)
Nom: 320
Min: 270
Max: 370
Length (µm)
Nom: 123
Min: 120
Max: 125
Spring Const (N/m)
Nom: 37
Min: 19
Max: 55
Width (µm)
Nom: 40
Min: 37
Max: 42
Price: $756.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
TESPA-V2-SS, SUPERSHARP, 10-PACK.  Pack of 10 High quality etched silicon probes with backside Aluminum reflex coating, for TappingMode™ and other non-contact modes. Unmounted for use on standard AFMs.


Super Sharp TESPA probe based off of our TESPA-V2 probe combines the high consistency of the V2 design with a high aspect ratio, supersharp tip guaranteed by Bruker's proprietary process. The small spike is processed to < 10 degree half angles for the first 200 nm of the tip apex.
  • 42 N/m, 320 kHz
  • 2-5 nm tip radius of curvature
  • 10-pack of probes
Tip Specification
TESPA-V2-SS Tip Image
2-5 nm tip radius of curvature. Super sharp spike tip. The small spike is silicon tip processed to <10deg half angles for the first 200 nm of the tip apex.
Tip Height (h): 12.5 µm
Front Angle (FA): 25.0º
Back Angle (BA): 17.5º
Side Angle (SA): 20.0º
Cantilever Specification
TESPA-V2-SS Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.3µm
Cantilever Thickness (RNG): 2.8 - 3.8µm
Back Side Coating: Reflective Aluminum