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TESP-V2-SS

TESP-V2 View Larger
Geometry
Rectangular
Tip Radius (nm)
Nom: 2
Max: 5
Frequency (KHz)
Nom: 320
Min: 270
Max: 370
Length (µm)
Nom: 123
Min: 120
Max: 125
Spring Const (N/m)
Nom: 37
Min: 19
Max: 55
Width (µm)
Nom: 40
Min: 37
Max: 42
3 Total Related Products
TESP-HAR
42N/m, 320kHz, High Aspect Ratio (5:1), No Reflecting CoatingView...
TESP-V2

 

 

 

 

 

A pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's. 

Bruker AFM Probes has introduced an improved version of its popular, TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPA-V2.  
View...
TESPA-V2
A pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's. 

Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESP-V2.  
View...
Price: $735.00 (USD)
Sold in packs of 10
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Shipping Info
Probe Selection Guide
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Questions? Free, Online Consulting
+1 (800) 715-8440
Overview

Super Sharp TESP probe based off of our TESP-V2 probe with super sharp spike tip.  The small spike Si processed to <10 degree half angles for the first 200 nm of the tip apex.

  • 42 N/m, 320 kHz
  • 2-5nm Tip Radius of Curvature
  • 10-pack of probes.

Tip Specification
TESP-V2-SS Tip Image
2-5nm Tip Radius of Curvature. Super sharp spike tip. The small spike is silicon tip processed to <10deg half angles for the first 200nm of the tip apex.
Tip Height (h): 12.5 µm
Front Angle (FA): 25.0º
Back Angle (BA): 17.5 º
Side Angle (SA): 20 .0º
Cantilever Specification
TESP-V2-SS Cantilever Image
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.3µm
Cantilever Thickness (RNG): 2.8 - 3.8µm
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