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Tip Radius (nm)
Nom: 100
Max: 150
Frequency (KHz)
Nom: 60
Min: 15
Max: 110
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 2
Min: 0.7
Max: 4
Width (µm)
Nom: 40
Min: 38
Max: 42
Price: $1,400.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting

Bruker’s conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance.

In electrical applications, these probes provide high performance in Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.

The DDRFESP40 probe provides:

• High performance contact resonance imaging with Dimension Icon

• High electrical performance due to its consistent tip shape

• Sensitive nanoelectrical measurements with highly conductive coating

• High resolution electrical imaging with a sharp conductive tip

• High quality probe manufactured by Bruker AFM Probes

• Low spring constant for contact resonance on softer materials such as polymers

Other applications of this probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications.

Tip Specification
DDRFESP40 Tip Image
Tip Height (h): 10-15 µm
Front Angle (FA): 15+/-2º
Back Angle (BA): 25+/-2º
Side Angle (SA): 17.5+/-2º
Cantilever Specification
DDRFESP40 Cantilever Image
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2µm
Cantilever Thickness (RNG): 1.75-2.25µm
Back Side Coating: Reflective Aluminum