RTESPA-150-30

 

A pack of 10 High quality etched silicon probes for soft TappingMode™ andother non-contact modes.  Unmounted for use on standard AFM's.

Bruker's flagship MPP probes are the preferred choice for high-sensitivity silicon probe imaging in TappingMode or non-contact mode in air.  Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features.  With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types. 

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RTESP-150.

 

View...

Building on the superior imaging performance of the ScanAsyst Air HPI probe, the ScanAsyst-Air-HPI-30 provides accurate nanomechanical mapping on very soft samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants.

End radii are controlled to 30nm +/- 15%. Spring constants are individually calibrated and guaranteed within 10% . Parameters are contained in the QR code on the box for fast and error free reading with the QR reader included with Bruker’s new PeakForce QNM high accuracy kit available for Dimension Icon. The low nominal 0.25N/m spring constant is most suitable for extremely soft polymer samples (typically kPa to MPa range). For stiffer samples, see the whole series of calibrated probes.

- Nanomechanical mapping with FFV or PFQNM on Dimension Icon
- Controlled 30nm end radius
- Individually calibrated spring constant, 0.25N/m nominal
- Parameters contained in QR code
- One pack of 5 probes


View...

Building on Bruker’s flagship series of Tapping probes with rotated tip, the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants.

End radii are controlled to 30nm +/- 15%. Spring constants are individually calibrated and guaranteed within 10% . Parameters are contained in the QR code on the box for fast and error free reading with the QR reader included with Bruker’s new PeakForce QNM high accuracy kit available for Dimension Icon. The high nominal 40N/m spring constant is most suitable for stiff (typically GPa) samples. For other samples, see the whole series of calibrated probes.

- Nanomechanical mapping with FFV or PFQNM on Dimension Icon
- Controlled 30nm end radius
- Individually calibrated spring constant, 40N/m nominal
- Parameters contained in QR code
- One pack of 5 probes

View...

 

Building on Bruker’s flagship series of Tapping probes with rotated tip, the RTESPA-525-30 provides accurate nanomechanical mapping on very stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants.

End radii are controlled to 30nm +/- 15%. Spring constants are individually calibrated and guaranteed within 20% . Parameters are contained in the QR code on the box for fast and error free reading with the QR reader included with Bruker’s new PeakForce QNM high accuracy kit available for Dimension Icon. The very high low nominal 40N/m spring constant is most suitable for very stiff (typically >> 1 GPa) samples. For other samples, see the whole series of calibrated probes.

- Nanomechanical mapping with FFV or PFQNM on Dimension Icon
- Controlled 30nm end radius
- Individually calibrated spring constant, 200N/m nominal
- Parameters contained in QR code
- One pack of 5 probes

 

View...