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Tip Radius (nm)
Nom: 40
Frequency (KHz)
Nom: 75
Min: 45
Max: 115
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 2.8
Min: 0.5
Max: 9.5
Width (µm)
Nom: 28
Min: 20
Max: 35
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This is the ideal probe to improve your MFM capabilities. It combines standard force modulation cantilever characteristics with greatly improved magnetic resolution. Depending on coating type magnetic resolution of beyond 25 nm can be obtained. Its single sided stable magnetic configuration makes it also suitable for operation in external applied magnetic fields or strong sample fields. 

The SC-20-LM has a side-coating for 20 nm Ni and a backside reflex coating of Al. 

Tip Specification
Tip Height (h): 10-15 µm
Cantilever Specification
Material: Side-coating of 20 nm NiCo and a backside reflex coating of Al
Cantilever Thickness (Nom): 3µm
Cantilever Thickness (RNG): 2-4µm
Back Side Coating: Al