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Force Spectroscopy
Force spectroscopy is the direct measurement of tip-sample interaction of forces as a function of the gap between the tip and sample. If there is force acting on the AFM probe, the cantilever will deflect, and this deflection is proportional to the force acting on the cantilever.
Frequency
Nom: 65KHz
Spring Const.
Nom: 0.35N/m
Geometry
A Triangle
Tip Radius
20nmMaterial
Silicon NitrideCoating
B: Reflective Gold
Frequency
Nom: 11.0KHz
Spring Const.
Nom: 0.080N/m
Geometry
A A-frame
Tip Radius
5,000nmMaterial
Silicon NitrideCoating
B: Reflective Gold
Frequency
Nom: 11.0KHz
Spring Const.
Nom: 0.080N/m
Geometry
A A-frame
Tip Radius
5,000nmMaterial
Silicon NitrideCoating
B: Reflective Gold
Frequency
Nom: 6.0KHz
Spring Const.
Nom: 0.080N/m
Geometry
A A-frame
Tip Radius
10,000nmMaterial
Silicon NitrideCoating
B: Reflective Gold
Frequency
Nom: 22KHz
Spring Const.
Nom: 0.07N/m
Geometry
A Triangular
Tip Radius
20nmMaterial
Silicon NitrideCoating
B: Reflective Gold
Frequency
Nom: 18.0KHz
Spring Const.
Nom: 0.080N/m
Geometry
A A-frame
Tip Radius
1,000nmMaterial
Silicon NitrideCoating
B: Reflective Gold
Frequency
Nom: 18.0KHz
Spring Const.
Nom: 0.080N/m
Geometry
A A-frame
Tip Radius
1,000nmMaterial
Silicon NitrideCoating
B: Reflective Gold
Frequency
Nom: 6.0KHz
Spring Const.
Nom: 0.080N/m
Geometry
A A-frame
Tip Radius
10,000nmMaterial
Silicon NitrideCoating
B: Reflective Gold