Skip to Main Content


Contact etched silicon probes consist of an integrated single crystal silicon cantilever and tip.  The tip shape is identical to that of the most commonly used TappingMode probes (model TESP), however, the cantilever is longer which provides the low spring constant needed for contact mode imaging.  The tip has a smaller radius of curvature than most silicon nitride tips and steeper sidewalls, making it a good choice for applications requiring a higher aspect ratio tip.  These probes can also be used with interferometer-based detection AFMs because of their long cantilever length.