Home → Product
Easy Product Wizard
Search Products Clear selection


Product Description:

A pack of 10 High quality etched silicon probes for soft TappingMode™ imaging and force modulation in air.  Unmounted for use on standard AFM's.

Bruker's flagship MPP probes are the preferred choice for high-sensitivity silicon probe imaging in TappingMode or non-contact mode in air.  Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features.  With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types. 

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RFESP-40.

Add To Cart

Model Instrument Mount Pack Size Price Pack Quantity
RFESPA-40 All Unmounted 10 $385.00 (USD)

Quantity discounts available

2-6$327.25 (USD)
7-15$288.75 (USD)
16-24$250.25 (USD)
25-37$211.75 (USD)
38+$173.25 (USD)

Shape Resonant Freq. kHz Spring Const. N/m Length µm Width µm
Nom. Min. Max. Nom. Min. Max. Nom. Min. Max. Nom. Min. Max.
Rectangular 40 10 70 0.9 0.35 2 225 215 235 40 38 42

Tip Specification

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Geometry: Rotated (Symmetric)
Tip Height (h): 10 - 15µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2 º
Side Angle (SA): 17.5 ± 2 º
Tip Radius (Nom): 8 nm
Tip Radius (Max): 12 nm
Tip SetBack (TSB)(Nom): 9.5 µm
Tip Set Back (TSB)(RNG): 7 - 12 µm

Cantilever Specification

Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating are recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 1.8 µm
Cantilever Thickness (RNG): 1.05 - 2.55 µm
Back Side Coating: Reflective Aluminum
Optional Product Offerings
A pack of 10 High quality etched silicon pro...
Details | Shop
A wafer of High quality etched silicon probe...
Details | Shop
A wafer of High quality etched silicon probe...
Details | Shop
A pack of 10 High quality etched silicon probes fo...
Details | Shop